Ulrich Lambert | Researchain

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Archive | 1999

PRODUCTION OF SINGLE CRYSTAL

Von Wilfried Dr Ammon; Dieter Graef; Ulrich Lambert; Ruediger Schmolke; ウィルフリート・フォン・アモン; ウルリッチ・ランバート; ディーター・グレフ; リディガー・シュモルク

Archive | 1997

Process for producing silicon semiconductor wafers with low defect density

Dieter Graef; Wilfried von Ammon; Reinhold Wahlich; Peter Krottenthaler; Ulrich Lambert

Archive | 1999

Process for producing a single crystal

Wilfried von Ammon; Rüdiger Schmolke; Dieter Gräf; Ulrich Lambert

Archive | 1997

Method for producing silicon wafers with a low defect-density

Dieter Graef; Ammon Wilfried Von; Reinhold Wahlich; Peter Krottenthaler; Ulrich Lambert

Archive | 2004

SOI wafer and process for producing IT

Robert Dr. Dipl.-Chem. Hölzl; Dirk Dantz; Andreas Dr. Dipl.-Phys. Huber; Ulrich Lambert; Reinhold Wahlich

Archive | 2011

Monocrystalline Semiconductor Wafer Comprising Defect-Reduced Regions And Method For Producing It

Dieter Dipl.-Min. Knerer; Andreas Huber; Ulrich Lambert; Friedrich Dr. Dipl.-Phys. Passek

Archive | 2006

Process for producing silicon semiconductor wafers with defined defect properties, and silicon semiconductor wafers having these defect properties

Wilfried von Ammon; Walter Haeckl; Andreas Huber; Ulrich Lambert

Archive | 2012

Manufacturing method of single crystal semiconductor wafer

Passek Friedrich; Andreas Huber; Dieter Dipl.-Min. Knerer; Ulrich Lambert; フーバーアンドレアス; ランベルトウルリヒ; クネーラーディーター; パセックフリードリヒ

Archive | 2007

Single crystal semiconductor wafer having region with reduced defects, and manufacturing method thereof

Passek Friedrich; Andreas Huber; Dieter Dipl.-Min. Knerer; Ulrich Lambert; フーバーアンドレアス; ランベルトウルリヒ; クネーラーディーター; パセックフリードリヒ

Archive | 2004

Manufacturing method of silicon semiconductor wafer

Dieter Graef; Peter Krottenthaler; Ulrich Lambert; Ammon Wilfried Von; Reinhold Wahlich; フォンアモンヴィルフリート; ラムベルトウルリッヒ; グラエフディエター; クロテンターラーペーター; ヴァリッヒラインホルト

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