Valerio Guarnieri
University of Verona
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Featured researches published by Valerio Guarnieri.
international conference on hardware/software codesign and system synthesis | 2012
Daniel Lorenz; Kim Grüttner; Nicola Bombieri; Valerio Guarnieri; Sara Bocchio
The paper presents a novel abstraction methodology for generating time- and power-annotated TLM models from synthesizable RTL descriptions. The proposed techniques allow the integration of existing RTL IP components into virtual platforms for early software development and platform design, configuration, and exploration. With the proposed approach, IP models can be natively integrated into SystemC TLM-2.0 platforms and executed 10-1000 times faster compared to state-of-the-art RTL simulators. The abstraction methodology guarantees preservation of the behaviour and timing of the RTL models. Target technology dependent power properties of IP components are represented as power state-machines and integrated into the abstracted TLM models. The experimental results show a relative error less than 10\% of the abstracted models power consumption compared to state-of-the-art RTL power simulators. The evaluation has been performed on RTL IP components with different characteristics and demonstrates the effectiveness of the presented abstraction methodology.
Sensors | 2015
Diwei He; Stephen P. Morgan; Dimitrios Trachanis; Jan van Hese; Dimitris Drogoudis; Franco Fummi; Francesco Stefanni; Valerio Guarnieri; Barrie Hayes-Gill
Pulse oximetry is a noninvasive and continuous method for monitoring the blood oxygen saturation level. This paper presents the design and testing of a single-chip pulse oximeter fabricated in a 0.35 µm CMOS process. The chip includes photodiode, transimpedance amplifier, analogue band-pass filters, analogue-to-digital converters, digital signal processor and LED timing control. The experimentally measured AC and DC characteristics of individual circuits including the DC output voltage of the transimpedance amplifier, transimpedance gain of the transimpedance amplifier, and the central frequency and bandwidth of the analogue band-pass filters, show a good match (within 1%) with the circuit simulations. With modulated light source and integrated lock-in detection the sensor effectively suppresses the interference from ambient light and 1/f noise. In a breath hold and release experiment the single chip sensor demonstrates consistent and comparable performance to commercial pulse oximetry devices with a mean of 1.2% difference. The single-chip sensor enables a compact and robust design solution that offers a route towards wearable devices for health monitoring.
design, automation, and test in europe | 2012
Nicola Bombieri; Franco Fummi; Valerio Guarnieri
This paper presents FAST-GP, a framework for functional verification of RTL designs, which is based on fault injection and parallel simulation on GP-GPUs. Given a fault model, the framework translates the RTL code into an injected C code targeting NVIDIA GPUs, thus allowing a very fast parallel automatic test pattern generation and fault simulation. The paper compares different configurations of the framework to better exploit the architectural characteristics of such GP-GPUs (such as thread synchronization, branch divergence, etc.) by considering the architectural characteristics of the RTL design under verification (i.e., complexity, size, number of injected faults, etc.). Experimental results have been conducted by applying the framework to different designs, in order to prove the methodology effectiveness.
IEEE Transactions on Computers | 2014
Nicola Bombieri; Franco Fummi; Valerio Guarnieri; Graziano Pravadelli
Transaction-level modeling (TLM) has become the de-facto reference modeling style for system-level design and verification of embedded systems. It allows designers to implement high-level communication protocols for simulations up to 1000 × faster than at register-transfer level (RTL). To guarantee interoperability between TLM IP suppliers and users, designers implement the TLM communication protocols by relying on a reference standard, such as the standard OSCI for SystemC TLM. Functional correctness of such protocols as well as their compliance to the reference TLM standard are usually verified through user-defined testbenches, whose high quality and completeness play a key role for an efficient TLM design and verification flow. This article presents a methodology to apply mutation analysis, a technique applied in literature for SW testing, for measuring the testbench quality in verifying TLM protocols. In particular, the methodology aims at (i) qualifying the testbenches by considering both the TLM protocol correctness and their compliance to a defined standard (i.e., OSCI TLM), (ii) optimizing the simulation time during mutation analysis by avoiding mutation redundancies, and (iii) driving the designers in the testbench improvement. Experimental results on benchmarks of different complexity and architectural characteristics are reported to analyze the methodology applicability.
latin american test workshop - latw | 2011
Valerio Guarnieri; Nicola Bombieri; Graziano Pravadelli; Franco Fummi; Hanno Hantson; Jaan Raik; Maksim Jenihhin; Raimund Ubar
Mutation analysis has been borrowed from the software testing domain as a technique for evaluating the quality of testbenches in validating digital systems. This paper presents a new method for applying mutation analysis on SystemC hardware designs at Transaction-Level Modeling (TLM). The method injects mutants by directly perturbing the SystemC code. Five key categories of mutation operators are implemented in order to speed up the analysis process. In the paper, a comparison of mutation analysis at two different abstraction levels — TLM and Register-Transfer Level (RTL), is carried out. The experiments show that mutation analysis is considerably faster at TLM than it is at RTL while achieving almost equal mutant coverage. Last but not least, TLM mutation analysis provides also more readable feedback for the engineer to improve the testbench. To the best of our knowledge this is the first method for mutation analysis directly working on uncompiled SystemC TLM code.
high level design validation and test | 2010
Nicola Bombieri; Franco Fummi; Valerio Guarnieri
Transaction-level modeling (TLM) is the most promising technique to deal with the increasing complexity of modern embedded systems. TLM provides designers with high-level interfaces and communication protocols for abstract modeling and efficient simulation of system platforms. The Open SystemC Initiative (OSCI) has recently released the TLM-2.0 standard, to standardize the interface between component models for bus-based systems. The TLM standard aims at facilitating the interchange of models between suppliers and users, and thus encouraging the use of virtual platforms for fast simulation prior to the availability of register-transfer level (RTL) code. On the other hand, because a TLM IP description does not include the implementation details that must be added at the RTL, the process to synthesize TLM designs into RTL implementations is still manual, time spending and error prone. In this context, this paper presents a methodology for automating the TLM-to-RTL synthesis by applying the theory of high-level synthesis (HLS) to TLM, and proposes a protocol synthesis technique based on the extended finite state machine (EFSM) model for generating the RTL IP interface compliant with any RTL bus-based protocol.
Design Automation for Embedded Systems | 2012
Nicola Bombieri; Franco Fummi; Valerio Guarnieri; Francesco Stefanni; Sara Vinco
SystemC is the de-facto standard language for system-level modeling, architectural exploration, performance analysis, software development, and functional verification of embedded systems. Nevertheless, it has been proved that the performance of the SystemC implementation is typically less optimal than commercial VHDL/Verilog simulators when used for register transfer level (RTL) simulation. This is mainly due to the “slow” implementation of bit-accurate data types provided by the standard library. Such a problem limits the simulation performance even when SystemC designs are implemented at higher levels of abstraction (i.e., transaction-level modeling—TLM) and still make use of bit-accurate data types (e.g., for a more accurate verification, or in TLM descriptions automatically generated from RTL). This article presents HDTLib, a new bit-accurate data type library that increases the simulation speed up to 3.45× at RTL and up to 10× at TLM. In addition, when the level of abstraction rises from RTL and better simulation performance is required, accuracy of HW-dependent behaviors is no longer necessary. Thus, the article presents a type abstraction methodology to get rid of low level behaviors and how such a methodology can be combined with HDTLib for guaranteeing a sound tradeoff between accuracy and simulation speed. Finally, more recent works have proposed efficient and promising techniques to boost SystemC simulation through general purpose graphics processing unit (GP-GPU) architectures. In such parallel frameworks, the standard SystemC library for bit-accurate data types is not supported, with a consequent limitation of their application to actual designs. This article shows how HDTLib has been implemented for applying also to these today many-core architectures.
european test symposium | 2011
Nicola Bombieri; Franco Fummi; Valerio Guarnieri
Different fault injection techniques based on simulation have been proposed in the past for functional verification of register transfer level (RTL) IP models. They allow designers to model any type of fault and provide the quality of test patterns through the fault coverage estimation. Nevertheless, the low speed of such a cycle-accurate RTL simulation involves a trade-off between the simulation time and the achieved fault coverage. On the other hand, Transaction-level modeling (TLM) allows a simulation speed-up up to 1000x with respect to RTL. This paper presents a methodology to accelerate RTL fault simulation through automatic RTL-to-TLM abstraction. The methodology abstracts injected RTL models into equivalent injected TLM models thus allowing a very fast automatic test pattern generation at TLM level. The paper shows how the generated TLM test patterns can be automatically synthesized into RTL test patterns by exploiting the structural information of the RTL model extracted during the abstraction process. Experimental results have been applied to several designs of different size and complexity to show the methodology effectiveness.
system on chip conference | 2010
Nicola Bombieri; Franco Fummi; Valerio Guarnieri
Transaction-level modeling (TLM) is the leading design style to deal with the increasing complexity of modern embedded systems. TLM provides designers with high-level interfaces and communication protocols for abstract modeling and efficient simulation of system platforms. The Open SystemC Initiative (OSCI) has recently released the TLM-2.0 standard for facilitating the interchange of models between suppliers and users, and thus encouraging the use of virtual platforms for fast simulation prior to the availability of register-transfer level (RTL) code. On the other hand, verification of TLM IPs still relies on simulation-based techniques since formal verification methodologies (such as model checking) and tools are not mature enough to be applied at TLM level. In this paper, we propose a methodology to apply existing RTL model checkers for verifying TLM IPs. The methodology relies on the automatic synthesis of the TLM IP models into equivalent RTL descriptions, in order to verify the TLM properties through the equivalent RTL model of the IPs.
Journal of Electronic Testing | 2012
Valerio Guarnieri; Giuseppe Di Guglielmo; Nicola Bombieri; Graziano Pravadelli; Franco Fummi; Hanno Hantson; Jaan Raik; Maksim Jenihhin; Raimund Ubar
Mutation analysis has gained consensus during the last decades as being an efficient technique for measuring the quality of SW testbench. More recently, it has been efficiently applied for validating testbenches of embedded system models implemented in hardware description language (HDL) at different abstraction levels (i.e., RTL, TLM). This article analyzes how mutation analysis performed at TLM can be reused at RTL and, in particular, how such a reuse can help designers in (i) optimizing the time spent for simulation at RTL, and (ii) improving the RTL testbench quality. Two alternatives of TLM mutation analysis reuse are presented and investigated for proposing an efficient methodology of RTL mutation analysis. Through experimental results, the proposed methodology is compared to the standard RTL mutation analysis to confirm its efficiency in terms of both simulation time and reached mutation coverage.