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Dive into the research topics where Yasuhiko Sugiyama is active.

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Featured researches published by Yasuhiko Sugiyama.


Japanese Journal of Applied Physics | 2012

High-Precision Quadrupole Correction Lens for Ion-Beam Focusing: Design and Test of Multistage Self-Aligned Quadrupole Correction-Lens System

Shigeo Okayama; Yasuhiko Sugiyama

A multistage self-aligned quadrupole correction lens, which consists of two lens casings, is developed. Each lens-casing cylinder consists of three quadrupole and two aperture electrodes. All lens components in lens-casing cylinders are fabricated to achieve an electrode alignment accuracy better than 1 µm. Azimuth errors between entrance and exit lens-casing cylinders can be corrected using the rotary flange fastened to the entrance lens-casing cylinder. The correction-lens system is installed as the probe-forming objective lens in place of the rotationally symmetrical objective lens of the focused ion-beam system. Simulation results show that a four-stage quadrupole correction lens is useful as a correctable probe-forming objective lens because all aperture aberration coefficients can be effectively corrected under the condition of relatively low chromatic aberration. Probe-forming properties and beam shape affected by aperture aberrations of the four-stage quadrupole correction-lens system are observed by scanning ion microscope images.


Japanese Journal of Applied Physics | 2010

Deposition Yield and Physical Properties of Carbon Films Deposited by Focused-Ion-Beam Chemical Vapor Deposition

Takashi Kaito; Hiroshi Oba; Yasuhiko Sugiyama; Anto Yasaka; Jun-ichi Fujita; Tsuneo Suzuki; Kazuhiro Kanda; Shinji Matsui

The deposition yield and physical properties of carbon films fabricated by focused-ion-beam (FIB) chemical vapor deposition were examined using several ion beam species of hydrogen, helium, xenon, and gallium. A gas-FIB was generated using an inductively coupled plasma ion source. It was found that the deposition yield is proportional to the total stopping power of the beam that penetrates into the carbon film. The physical properties of the carbon films deposited using gas-FIB are similar to those of films deposited using Ga-FIB, except for the Youngs modulus.


Archive | 1990

Converged charge beam processing method

Koji Iwasaki; Yasuhiko Sugiyama


Archive | 2012

Nitrogen ions from a gas field ion source held at a pressure of 1.0 x 10^(-6) pa to 1.0 x 10^(-2) pa

Anto Yasaka; Fumio Aramaki; Yasuhiko Sugiyama; Tomokazu Kozakai; Osamu Matsuda


Archive | 2014

FOCUSED ION BEAM APPARATUS AND CONTROL METHOD THEREOF

Fumio Aramaki; Yasuhiko Sugiyama; Hiroshi Oba


Archive | 2013

Method for fabricating emitter

Yasuhiko Sugiyama; Kazuo Aita; Fumio Aramaki; Tomokazu Kozakai; Osamu Matsuda; Anto Yasaka


Journal of Electron Microscopy | 2004

Post-thinning technique for a lifted-out membrane

Shoji Sadayama; Yasuhiko Sugiyama; Koji Iwasaki; Anto Yasaka


international conference on micro electro mechanical systems | 2018

Plasma ion-beam 3D printing: A novel method for rapid fabrication of customized MEMS sensors

Keiji Watanabe; Masaharu Kinoshita; Toshiyuki Mine; Masatoshi Morishita; Koji Fujisaki; Ryohei Matsui; Misuzu Sagawa; Shuntaro Machida; Hiroshi Oba; Yasuhiko Sugiyama; Nobuyuki Sugii; Daisuke Ryuzaki; Hideaki Kurata; Shinji Nishimura


Archive | 2016

APPARATUR MIT FOKUSSIERTEM IONENSTRAHL

Anto Yasaka; Tomokazu Kozakai; Osamu Matsuda; Yasuhiko Sugiyama; Kazuo Aita; Fumio Aramaki; Hiroshi Oba


Archive | 2016

PLASMA ION SOURCE AND CHARGED PARTICLE BEAM APPARATUS

Hiroshi Oba; Yasuhiko Sugiyama; Mamoru Okabe

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