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Featured researches published by Yupin Fong.


IEEE Journal of Solid-state Circuits | 2006

A 146-mm/sup 2/ 8-gb multi-level NAND flash memory with 70-nm CMOS technology

Takahiko Hara; Koichi Fukuda; Kazuhisa Kanazawa; Noboru Shibata; Koji Hosono; Hiroshi Maejima; Michio Nakagawa; Takumi Abe; Masatsugu Kojima; Masaki Fujiu; Yoshiaki Takeuchi; Kazumi Amemiya; Midori Morooka; Teruhiko Kamei; Hiroaki Nasu; Chi-Ming Wang; Kiyofumi Sakurai; Naoya Tokiwa; Hiroko Waki; Tohru Maruyama; Susumu Yoshikawa; Masaaki Higashitani; Tuan Pham; Yupin Fong; Toshiharu Watanabe

An 8-Gb multi-level NAND Flash memory with 4-level programmed cells has been developed successfully. The cost-effective small chip has been fabricated in 70-nm CMOS technology. To decrease the chip size, a one-sided pad arrangement with compacted core architecture and a block address expansion scheme without block redundancy replacement have been introduced. With these methods, the chip size has been reduced to 146 mm/sup 2/, which is 4.9% smaller than the conventional chip. In terms of performance, the program throughput reaches 6 MB/s at 4-KB page operation, which is significantly faster than previously reported and very competitive with binary Flash memories. This high performance has been achieved by the combination of the multi-level cell (MLC) programming with write caches and with the program voltage compensation technique for neighboring select transistors. The read throughput reaches 60 MB/s using 16I/O configuration.


international solid-state circuits conference | 2012

128Gb 3b/cell NAND flash memory in 19nm technology with 18MB/s write rate and 400Mb/s toggle mode

Yan Li; Seungpil Lee; Ken Oowada; Hao Nguyen; Qui Nguyen; Nima Mokhlesi; Cynthia Hsu; Jason Li; Venky Ramachandra; Teruhiko Kamei; Masaaki Higashitani; Tuan Pham; Mitsuaki Honma; Yoshihisa Watanabe; Kazumi Ino; Binh Le; Byungki Woo; Khin Htoo; Tai-Yuan Tseng; Long Pham; Frank Tsai; Kwang-ho Kim; Yi-Chieh Chen; Min She; Jong Yuh; Alex Chu; Chen Chen; Ruchi Puri; Hung-Szu Lin; Yi-Fang Chen

This paper addresses challenges with improvements made over previous NAND generations to achieve high performance while maintaining a low fail-bit count (FBC) and cost savings from an improved architecture and tightly packed peripheral circuits. Air gap [2,3] technology further improves write throughput by reducing neighbor interference and WL RC. A toggle mode 400Mb/s I/O interface reduces system overhead and enhances overall performance.


Archive | 2002

Operating techniques for reducing effects of coupling between storage elements of a non-volatile memory operated in multiple data states

Jian Chen; Tomoharu Tanaka; Yupin Fong; Khandker N. Quader


Archive | 2002

Techniques for reducing effects of coupling between storage elements of adjacent rows of memory cells

Raul-Adrian Cernea; Khandker N. Quader; Yan Li; Jian Chen; Yupin Fong


Archive | 2002

Multi-state nonvolatile memory capable of reducing effects of coupling between storage elements

Jian Chen; Tomoharu Tanaka; Yupin Fong; Khandker N. Quader


international solid-state circuits conference | 2009

A 16 Gb 3-Bit Per Cell (X3) NAND Flash Memory on 56 nm Technology With 8 MB/s Write Rate

Yan Li; Seungpil Lee; Yupin Fong; Feng Pan; Tien-Chien Kuo; Jongmin Park; Tapan Samaddar; Hao Thai Nguyen; Man L. Mui; Khin Htoo; Teruhiko Kamei; Masaaki Higashitani; Emilio Yero; Gyuwan Kwon; Phil Kliza; Jun Wan; Tetsuya Kaneko; Hiroshi Maejima; Hitoshi Shiga; Makoto Hamada; Norihiro Fujita; Kazunori Kanebako; Eugene Tam; Anne Koh; Iris Lu; Calvin Chia-Hong Kuo; Trung Pham; Jonathan Huynh; Qui Nguyen; Hardwell Chibvongodze


Archive | 2011

Verification process for non-volatile storage

Gerrit Jan Hemink; Shih-Chung Lee; Toru Miwa; Yupin Fong; Jun Wan; Ken Oowada


Archive | 2009

Erase-verification process for non-volatile storage

Gerrit Jan Hemink; Shih-Chung Lee; Toru Miwa; Yupin Fong; Jun Wan; Ken Oowada


Archive | 2010

Available verification for coarse/fine programming of non-volatile memory

Guterman Daniel C; Nima Mokhlesi; Yupin Fong


Archive | 2010

Method for operating or programming non-volatile memory unit

Raul-Adrian Cemea; Jian Chen; Yupin Fong; Yan Li; Quader Khandker N

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