Benny W H Lai
Agilent Technologies
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Publication
Featured researches published by Benny W H Lai.
international test conference | 2001
Young Gon Kim; Benny W H Lai; Kenneth P. Parker; Jeff Rearick
The use of AC coupling capacitors on high-speed interconnects prevents the use of traditional DC-based boundary-scan techniques to test for board manufacturing defects. A solution is provided by a novel scheme that makes use of frequency discrimination using simple digital circuits that are easily integrated with the 1149.1 boundary-scan standard. Simulation results are presented which show the effectiveness of this method, and its robustness and scalability are compared with alternative solutions.
Archive | 2004
Benny W H Lai
Archive | 2003
Benny W H Lai
Archive | 2003
Nurwati S Devnani; James Oliver Barnes; Charles E. Moore; Benny W H Lai
Archive | 2001
Benny W H Lai; Young Gon Kim; Kenneth P. Parker; Jeff Rearick
Archive | 1999
Benny W H Lai; Tony Lin; Charles L. Wang
Archive | 2001
Charles L. Wang; Benny W H Lai; Charles E. Moore; Philip W. Fisher
Archive | 1999
Benny W H Lai
Archive | 2001
Charles L. Wang; Benny W H Lai; Charles E. Moore; Philip W. Fisher
Archive | 2002
Charles L. Wang; Benny W H Lai; Charles E. Moore; Philip W. Fisher