Martha V. O'Bryan
Raytheon
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Publication
Featured researches published by Martha V. O'Bryan.
radiation effects data workshop | 1998
Martha V. O'Bryan; Kenneth A. LaBel; Ray Ladbury; Christian Poivey; James W. Howard; Robert A. Reed; Scott Kniffin; Stephen Buchner; John P. Bings; J.L. Titus; Steven D. Clark; Thomas L. Turflinger; Christina M. Seidleck; Cheryl J. Marshall; Paul W. Marshall; Hak S. Kim; Donald K. Hawkins; Martin A. Carts; James D. Forney; Michael R. Jones; Anthony B. Sanders; T.L. Irwin; Stephen R. Cox; Zoran Kahric; C. Palor; James A. Sciarini
We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects, proton-induced damage, and total ionizing dose. Devices tested include optoelectronics, digital, analog, linear bipolar, hybrid devices, analog-to-digital converters (ADCs), digital-to-analog converters (DACs), and DC-DC converters, among others.
radiation effects data workshop | 2000
Martha V. O'Bryan; Kenneth A. LaBel; Robert A. Reed; Raymond L. Ladbury; J.W. Howard; Stephen P. Buchner; Janet L. Barth; Scott Kniffin; Christina M. Seidleck; C.J. Marshal; P.W. Marshal; Hak S. Kim; Donald K. Hawkins; Martin A. Carts; James D. Forney; Anthony B. Sanders; Stephen R. Cox; C.J. Dunsmore; C. Palor
We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects and proton-induced damage. Devices tested include optoelectronics, digital, analog, linear bipolar, hybrid devices, Analog-to-Digital Converters (ADCs), Digital-to-Analog Converters (DACs), and DC-DC converters, among others.
radiation effects data workshop | 1999
Martha V. O'Bryan; Kenneth A. LaBel; Robert A. Reed; J.W. Howard; Janet L. Barth; Christina M. Seidleck; Paul W. Marshall; Cheryl J. Marshall; Hak S. Kim; Donald K. Hawkins; Martin A. Carts; Kurt E. Forslund
We present heavy ion and proton single event effects (SEE) as well as radiation damage ground test results for candidate spacecraft electronics. Microelectronics tested include digital, analog, and hybrid devices.
radiation effects data workshop | 2009
Martha V. O'Bryan; Kenneth A. LaBel; Jonathan A. Pellish; Dakai Chen; Jean-Marie Lauenstein; Cheryl J. Marshall; Ray Ladbury; Timothy R. Oldham; Hak S. Kim; Anthony M. Phan; Melanie D. Berg; Martin A. Carts; Anthony B. Sanders; Stephen Buchner; Paul W. Marshall; Michael A. Xapsos; Farokh Irom; Larry G. Pearce; E. T. Thomson; Theju M. Bernard; Harold William Satterfield; Alan P. Williams; Nick W. van Vonno; James Fred Salzman; Sam Burns; Rafi Albarian
We present the results of single event effects (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.
radiation effects data workshop | 2008
Donna J. Cochran; Stephen Buchner; Anthony B. Sanders; Kenneth A. LaBel; Martin A. Carts; Christian Poivey; Timothy R. Oldham; Raymond L. Ladbury; Martha V. O'Bryan; Susan R. Mackey
Radiation effects testing on a variety of candidate spacecraft electronics to total ionizing dose is studied. Devices tested include digital, analog, mixed signal, and hybrid devices.
radiation effects data workshop | 2012
Michael J. Campola; Donna J. Cochran; Alvin J. Boutte; Dakai Chen; Robert A. Gigliuto; Kenneth A. LaBel; Jonathan A. Pellish; Raymond L. Ladbury; Megan C. Casey; Edward P. Wilcox; Martha V. O'Bryan; Jean-Marie Lauenstein; Dan Violette; Michael A. Xapsos
Total ionizing dose and displacement damage testing is performed to characterize and determine the suitability of candidate electronics for NASA spacecraft and program use.
radiation effects data workshop | 2016
Michael J. Campola; Donna J. Cochran; Shannon Alt; Alvin J. Boutte; Dakai Chen; Robert A. Gigliuto; Kenneth A. LaBel; Jonathan A. Pellish; Raymond L. Ladbury; Megan C. Casey; Edward P. Wilcox; Martha V. O'Bryan; Jean-Marie Lauenstein; Michael A. Xapsos
Total ionizing dose and displacement damage testing is performed to characterize and determine the suitability of candidate electronics for NASA spacecraft and program use.
radiation effects data workshop | 2016
Martha V. O'Bryan; Kenneth A. LaBel; Carl M. Szabo; Dakai Chen; Michael J. Campola; Megan C. Casey; Jean-Marie Lauenstein; Edward P. Wilcox; Raymond L. Ladbury; Stanley A. Ikpe; Jonathan A. Pellish; Melanie D. Berg
We present the results of single event effect (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.
radiation effects data workshop | 2014
Kenneth A. LaBel; Martha V. O'Bryan; Dakai Chen; Michael J. Campola; Megan C. Casey; Jonathan A. Pellish; Jean-Marie Lauenstein; Edward P. Wilcox; Alyson D. Topper; Raymond L. Ladbury; Melanie D. Berg; Robert A. Gigliuto; Alvin J. Boutte; Donna J. Cochran; Stephen P. Buchner; Daniel P. Violette
We present results and analysis investigating the effects of radiation on a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects (SEE), proton-induced displacement damage (DD), and total ionizing dose (TID). This paper is a summary of test results.
radiation effects data workshop | 2010
Donna J. Cochran; Alvin J. Boutte; Michael J. Campola; Martin A. Carts; Megan C. Casey; Dakai Chen; Kenneth A. LaBel; Raymond L. Ladbury; Jean-Marie Lauenstein; Cheryl J. Marshall; Martha V. O'Bryan; Timothy R. Oldham; Jonathan A. Pellish; Anthony B. Sanders; Michael A. Xapsos
Vulnerability of a variety of candidate spacecraft electronics to total ionizing dose and displacement damage is studied. Devices tested include optoelectronics, digital, analog, linear bipolar devices, and hybrid devices.
