Doyle E. Bennett
Applied Materials
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MRS Proceedings | 1999
Thomas H. Osterheld; Steve Zuniga; Sidney P. Huey; Peter McKeever; Chad Garretson; Ben Bonner; Doyle E. Bennett; Raymond R. Jin
This paper reports a technological advancement in developing and implementing a novel retaining ring of advanced edge performance (AEP ring) for an advanced polishing head design. The AEP ring has been successfully used for significantly improved CMP performance in different CMP applications: oxide (PMD and ILD), shallow trench isolation (STI), polysilicon, metal (W and Cu), silicon-on-insulator (SOI), and silicon CMP. Robust processes have been developed using AEP ring along with many hardware upgrades for each application with extended runs to meet requirements of advanced IC device fabrication.
Archive | 1998
Boris Fishkin; Charles C. Garretson; Peter McKeever; Thomas H. Osterheld; Gopalakrishna B. Prabhu; Doyle E. Bennett; Benjamin A. Bonner; Sidney P. Huey
Archive | 1998
Brian J. Brown; Robert D. Tolles; James C. Nystrom; Doyle E. Bennett; Madhavi Chandrachood
Archive | 2003
Doyle E. Bennett; Boguslaw A. Swedek; Arulkumar Shanmugasundram
Archive | 1998
Ginetto Addiego; Doyle E. Bennett; Sen-Hou Ko; Tom Osterheld; Fred C. Redeker; アーディエゴ ジネット; コ セン−ホウ; エドワード ベネット ドイル; オスターヘルド トム; シー. レデカー フレッド
Archive | 2004
Doyle E. Bennett; Jeffrey Drue David; Manoocher Birang; Jimin Zhang; Boguslaw A. Swedek
Archive | 2003
Doyle E. Bennett; Sandeep R Koppikar; Jeffrey Drue David; Boguslaw A. Swedek; Nils Johansson
china semiconductor technology international conference | 2012
Sidney P. Huey; Balaji Chandrasekaran; Doyle E. Bennett; Stan D. Tsai; Kun Xu; Jun Qian; Siva Dhandapani; Jeff David; Bogdan Swedek; Lakshmanan Karuppiah
Archive | 2000
Kapila Wijekoon; Stan D. Tsai; Yuchun Wang; Doyle E. Bennett; Fred C. Redeker; Madhavi Chandrachood; Brian J. Brown
Archive | 2009
Doyle E. Bennett; Thomas H. Osterheld