Elie H. Najjar
Dow Chemical Company
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Featured researches published by Elie H. Najjar.
international microsystems, packaging, assembly and circuits technology conference | 2012
Elie H. Najjar; Leon R. Barstad; Jayaraju Nagarajan; Marc Lin; Maria Anna Rzeznik; Mark Lefebvre
A novel DC through hole filling process was formulated for high volume HDI and substrate core layer metallization production. The process yields high quality results over a wide current density range.
international microsystems, packaging, assembly and circuits technology conference | 2008
Mark Lefebvre; Elie H. Najjar; Luis Gomez; Leon R. Barstad
As higher and higher pin-count semiconductor packages are deployed in telecommunications and data processing applications, Printed Circuit Board (PCB) substrates must evolve to allow increased routing densities. To be capable of meeting these routing density and complexity needs, higher layer counts must be combined with filled microvias. High Density Interconnect (HDI) product of this type places significant new demands on the metallization processes, in particular, copper electroplating. To meet these needs, seemingly incompatible objectives must be met. Thinner and more uniform surface copper deposits have to be produced, increasingly difficult microvia geometries must be filled, through-hole throwing power delivered, while maintaining plating rates capable of delivering production throughputs. These demands often exceed the capability of current commercial copper electroplating processes. This paper describes a new pattern-plate, Direct Current (DC) copper electroplating process designed for HDI and packaging substrate applications. Microvia filling performance, plated through hole throwing power, surface distribution / trace profile and product reliability data, as a function of a variety of processing variables is discussed.
international microsystems, packaging, assembly and circuits technology conference | 2013
Ming-Yao Yen; Ming-Hung Chiang; Hsu-Hsin Tai; Hsien-Chang Chen; Kwok-Wai Yee; Crystal Li; Elie H. Najjar; Mark Lefebvre; Betty Xie
Electrolytic copper microvia filling is an enabling technology, prominently used in todays manufacture of high density interconnect (HDI) and packaging substrate applications for better reliability, increased circuit densification, design flexibility and thermal management. To meet these needs, seemingly incompatible objectives must be met. Thinner and more uniform surface copper deposits have to be produced; increasingly difficult microvia geometries must be filled, while maintaining plating rates capable of delivering production throughputs. This paper describes a new panel and pattern-plate, direct current (DC) copper electroplating process designed for packaging substrate and HDI applications. Microvia filling performance, surface distribution and product reliability as a function of a variety of physical processing variables is discussed.
international microsystems, packaging, assembly and circuits technology conference | 2009
Mark Lefebvre; Elie H. Najjar; Luis Gomez; Leon R. Barstad; Bruce Chen; Martin W. Bayes
Electrolytic copper microvia filling is an enabling technology, prominently used in todays manufacture of advanced HDI and packaging substrate product. In the high volume mass production of copper filled microvias, a wide variety of electroplating equipment designs are available to the fabricator. In this article, various aspects of electroplating equipment design used in the mass production of copper filled microvias are discussed, including a comparison of continuous and batch systems, anode materials, solution delivery (convection), and copper replenishment. The impacts of these variables on microvia filling performance, plated through hole throwing power, surface distribution, trace profile and bath life are described.
Archive | 2001
Wade Sonnenberg; Mark J. Kapeckas; David L. Jacques; Raymond Cruz; Leon R. Barstad; Elie H. Najjar; Eugene N. Step; Robert A. Binstead
Archive | 2011
Elie H. Najjar; Mark Lefebvre; Leon R. Barstad; Michael P. Toben
Archive | 2014
Nagarajan Jayaraju; Elie H. Najjar; Leon R. Barstad
Archive | 2011
Elie H. Najjar; Mark Lefebvre; Leon R. Barstad; Michael P. Toben
Archive | 2011
Zukhra l. Niazimbetova; Elie H. Najjar; Maria Anna Rzeznik; Erik Reddington
Archive | 2016
Nagarajan Jayaraju; Leon R. Barstad; Elie H. Najjar