Eric Kuah

Warpage and Thermal Characterization of Fan-Out Wafer-Level Packaging

In this paper, the warpage and thermal performances of fan-out wafer-level packaging (FOWLP) are investigated. Emphasis is placed on the characterization of the effects of FOWLP important parameters, such as chip size, chip thickness, package/chip area ratio, epoxy molding compound (EMC), chip EMC cap, reconstituted carrier material and thickness, and die-attach film, on the warpage after postmold cure and backgrinding of the EMC. The simulation results are compared to the experimental measurements. Also, the thermal performance (junction-to-ambient thermal resistance) of FOWLP with various chip thicknesses is characterized. Finally, some FOWLP important parameters affecting the warpage and thermal performances are recommended.

Large Format Encapsulation

This paper will review the challenges on large format encapsulation with respect to mold cap thickness control, encapsulant impact on moldability such as flow mark and flow mark on final product. Control of mold co-planarity is best performed dynamically during molding, otherwise it would be challenging to obtain good co-planarity within ± 20 μm. Moldability demand such encapsulant coverage with highly viscous material, flow-ability and flow mark are discussed. Warpage control heavily depends on the formulation of the encapsulant and the form of encapsulant, i.e., granular, liquid and sheet.

Large format packaging — An alternative format for discrete packaging: Its challenges and solutions

This paper will review the challenges on large format encapsulation with respect to mold cap thickness control, encapsulant impact on moldability such as flow mark and flow mark on final product. Control of mold co-planarity is best performed dynamically during molding, otherwise it would be challenging to obtain good co-planarity within ± 20 μm. Moldability demand such encapsulant coverage with highly viscous material, flow-ability and flow mark are discussed. Warpage control heavily depends on the formulation of the encapsulant and the form of encapsulant, i.e., granular, liquid and sheet.

Large format encapsulation

This paper will review the challenges on large format encapsulation with respect to mold cap thickness control, encapsulant impact on moldability such as flow mark and flow mark on final product. Control of mold co-planarity is best performed dynamically during molding, otherwise it would be challenging to obtain good co-planarity within ± 20 μm. Moldability demand such encapsulant coverage with highly viscous material, flow-ability and flow mark are discussed. Warpage control heavily depends on the formulation of the encapsulant and the form of encapsulant, i.e., granular, liquid and sheet.