Fa Xing Che

High-Reliability Low-Ag-Content Sn-Ag-Cu Solder Joints for Electronics Applications

Sn-Ag-Cu (SAC) alloy is currently recognized as the standard lead-free solder alloy for packaging of interconnects in the electronics industry, and high- Ag-content SAC alloys are the most popular choice. However, this choice has been encumbered by the fragility of the solder joints that has been observed in drop testing as well as the high cost of the Ag itself. Therefore, low-Ag-content SAC alloy was considered as a solution for both issues. However, this approach may compromise the thermal-cycling performance of the solders. Therefore, to enhance the thermal-cycling reliability of low-Ag-content SAC alloys without sacrificing their drop-impact performance, alloying elements such as Mn, Ce, Ti, Bi, In, Sb, Ni, Zn, Al, Fe, and Co were selected as additions to these alloys. However, research reports related to these modified SAC alloys are limited. To address this paucity, the present study reviews the effect of these minor alloying elements on the solder joint reliability of low-Ag-content SAC alloys in terms of thermal cycling and drop impact. Addition of Mn, Ce, Bi, and Ni to low-Ag-content SAC solder effectively improves the thermal-cycling reliability of joints without sacrificing the drop-impact performance. Taking into consideration the improvement in the bulk alloy microstructure and mechanical properties, wetting properties, and growth suppression of the interface intermetallic compound (IMC) layers, addition of Ti, In, Sb, Zn, Al, Fe, and Co to low-Ag-content SAC solder has the potential to improve the thermal-cycling reliability of joints without sacrificing the drop-impact performance. Consequently, further investigations of both thermal-cycling and drop reliability of these modified solder joints must be carried out in future work.

Reliability study of 3D IC packaging based on through-silicon interposer (TSI) and silicon-less interconnection technology (SLIT) using finite element analysis

Abstract Three-dimensional (3D) integration using the through-silicon via (TSV) approach becomes one promising technology in 3D packaging. 2.5D through-silicon interposer (TSI) is one of the applications of TSV technology, which provides a platform for realizing heterogeneous integration on the TSI interposer. However, TSV manufacturing faces several challenges including high cost. Si-less interconnection technology (SLIT) could overcome such challenges and provide the similar function and benefits as TSI interposer. In SLIT technology, TSVs and silicon substrate are eliminated and the back-end-of-line (BEOL) structures are the same as that in the TSI interposer. Thermo-mechanical reliability is still one important concern under process condition and thermal cycling (TC) test condition for both packaging technologies. In this study, solder joint reliability has been investigated and compared for both packaging technologies through finite element analysis (FEA). Reflow process induced low-k stress and package warpage have also been simulated and compared between packages with TSI and SLIT technologies. The simulation results show that SLIT-based package has comparable micro bump TC reliability as TSI-based package, but SLIT-based package has better C4 joint TC reliability than TSI-based package. SLIT-based package also has lower reflow-induced package warpage and low-k stress than TSI-based package. FEA simulation results verify that SLIT-based packaging is one of promising packaging technologies with good thermo-mechanical performance and cost efficiency.

Analysis of edge and corner bonded PSvfBGA reliability under thermal cycling conditions by experimental and finite element methods

Abstract In this paper, we present the thermal cycling test results for edge and corner bonded lead-free PSvfBGAs on a high- T g test board. The test results show that the characteristic lives of PSvfBGAs with edge bond acrylic, edge bond epoxy and corner bond epoxy are respectively about 0.6, 0.9 and 1.3 times of the PSvfBGAs without bonding. The epoxy with lowest CTE, highest storage modulus and smallest adhesive volume yielded best performance. The 3D quarter finite element model was also built to further study the failure mechanism.

The bulk alloy microstructure and tensile properties of Sn‐1Ag‐0.5Cu‐xAl lead‐free solder alloys (x=0, 1, 1.5 and 2 wt.%)

Purpose – The purpose of this paper is to investigate the effect of Al addition on the bulk alloy microstructure and tensile properties of the low Ag‐content Sn‐1Ag‐0.5Cu (SAC105) solder alloy.Design/methodology/approach – The Sn‐1Ag‐0.5Cu‐xAl (x=0, 1, 1.5 and 2 wt.%) bulk solder specimens with flat dog‐bone shape were used for tensile testing in this work. The specimens were prepared by melting purity ingots of Sn, Ag, Cu and Al in an induction furnace. Subsequently, the molten alloys were poured into pre‐heated stainless steel molds, and the molds were naturally air‐cooled to room temperature. Finally, the molds were disassembled, and the dog‐bone samples were removed. The solder specimens were subjected to tensile testing on an INSTRON tester with loading rate 10−3 s−1. The microstructural analysis was carried out using scanning electron microscopy/Energy dispersive X‐ray spectroscopy. Electron Backscatter Diffraction (EBSD) analysis was used to identify the IMC phases. To obtain the microstructure, th...

Effect of minor additions of Fe on bulk alloy microstructure and tensile properties of the low Ag‐content Sn‐1Ag‐0.5Cu solder alloy

Purpose – The purpose of this paper is to investigate the effects of small additions (0.1 and 0.3 wt%) of Fe on the bulk alloy microstructure and tensile properties of low Ag‐content Sn‐1Ag‐0.5Cu lead‐free solder alloy.Design/methodology/approach – Sn‐1Ag‐0.5Cu, Sn‐3Ag‐0.5Cu and Sn‐1Ag‐0.5Cu containing 1 and 3 wt.% Fe solder specimens were prepared by melting pure ingots of Sn, Ag, Cu and Fe in an induction furnace and subsequently remelting and casting to form flat dog‐bone shaped specimens for tensile testing. The solder specimens were subjected to tensile testing using an INSTRON tester with a loading rate 10‐3 s‐1. To obtain the microstructure, the solder samples were prepared by dicing, molding, grinding and polishing processes. The microstructural analysis was carried out using scanning electron microscopy/Energy Dispersive X‐ray spectroscopy. Electron backscatter diffraction (EBSD) analysis was used to identify the IMC phases.Findings – In addition to large primary β‐Sn grains, the addition of Fe t...