Hervé Le-Gall
STMicroelectronics
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Publication
Featured researches published by Hervé Le-Gall.
2016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW) | 2016
Hani Malloug; Manuel J. Barragan; Salvador Mir; Emmanuel Simeu; Hervé Le-Gall
This work proposes a novel approach for the design of high-quality on-chip sinusoidal signal generators using digital circuitry. The proposed generation technique is based on a simple digital shift-register that provides a set of phase-shifted versions of a digital square-wave signal. These square-wave signals are conveniently combined using a harmonic cancellation strategy to yield a spectrally pure sinusoidal output signal. The proposed strategy allows cancelling low-frequency harmonics close to the fundamental component of the generated sinusoidal signal, while a simple first order low-pass filter is used to attenuate higher order harmonic components. A simple one-shot calibration strategy is also presented in order to compensate the effects of the main non-idealities affecting the dynamic linearity of the generator. Statistical behavioral simulations are provided to demonstrate the feasibility of the proposed generator.
Journal of Electronic Testing | 2016
Guillaume Renaud; Manuel J. Barragan; Asma Laraba; Haralampos-G. D. Stratigopoulos; Salvador Mir; Hervé Le-Gall; Hervé Naudet
This work presents an efficient on-chip ramp generator targeting to facilitate the deployment of Built-In Self-Test (BIST) techniques for ADC static linearity characterization. The proposed ramp generator is based on a fully-differential switched-capacitor integrator that is conveniently modified to produce a very small integration gain, such that the ramp step size is a small fraction of the LSB of the target ADC. The proposed ramp generator is employed in a servo-loop configuration to implement a BIST version of the reduced-code linearity test technique for pipeline ADCs, which drastically reduces the volume of test data and, thereby, the test time, as compared to the standard test based on a histogram. The demonstration of the pipeline ADC BIST is carried out based on a mixture of transistor-level and behavioral-level simulations that employ actual production test data.
IEEE Design & Test of Computers | 2016
Manuel J. Barragan; Haralampos-G. D. Stratigopoulos; Salvador Mir; Hervé Le-Gall; Neha Bhargava; Ankur Bal
Accurate and efficient evaluation of alternative test methods is required for analog/mixed-signal circuits. To address this need, this article presents a semiautomated practical simulation flow specifically targeting circuits with long simulation times.
Archive | 2007
Hervé Le-Gall
Archive | 2011
Hervé Le-Gall
Archive | 2011
Hervé Le-Gall
Archive | 2011
Hervé Le-Gall
Archive | 2013
Hervé Le-Gall
Archive | 2013
Hervé Le-Gall
Archive | 2011
Hervé Le-Gall