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Dive into the research topics where Hiroshi Fuketa is active.

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Featured researches published by Hiroshi Fuketa.


international electron devices meeting | 2015

Robust and compact key generator using physically unclonable function based on logic-transistor-compatible poly-crystalline-Si channel FinFET technology

S. O'uchi; Yongxun Liu; Yohei Hori; Toshifumi Irisawa; Hiroshi Fuketa; Yukinori Morita; Shinji Migita; Takahiro Mori; Tadashi Nakagawa; Junichi Tsukada; Hanpei Koike; Meishoku Masahara; Takashi Matsukawa

This paper presents a robust and compact SRAM physically-unclonable-function (PUF) cell using a polycrystalline-Si channel (poly-Si) FinFET, for the first time. Its process is identical to that of a crystalline-Si FinFET except channel material. A systematic comparison between poly- and crystalline-Si FinFET PUF cells, reveals that the poly-Si cell improves the intra-PUF hamming distance to 1/3.4 of that of the crystalline-Si cell and 15k logic-transistors for stabilizing PUF reproducibility are reduced with keeping the same stability. For this analysis, a newly defined noise margin for SRAM PUFs, which is different from the SRAM static noise margin, is introduced.


international electron devices meeting | 2016

Demonstrating performance improvement of complementary TFET circuits by I on enhancement based on isoelectronic trap technology

Takahiro Mori; Hidehiro Asai; Junichi Hattori; Koichi Fukuda; Shintaro Otsuka; Yukinori Morita; S. O'uchi; Hiroshi Fuketa; Shinji Migita; Wataru Mizubayashi; Hiroyuki Ota; Takashi Matsukawa

We improved the performance of a complementary circuit comprising Si-based tunnel field-effect transistors (TFETs) by using isoelectronic trap (IET) technology. IET technology was found to increase the ON current (ION) 5 times in P-TFETs and 2 times in N-TFETs. The ION enhancement improved the inverter performance. In addition, ring oscillator (RO) circuit operation with the complementary TFET inverters was experimentally demonstrated for the first time. The RO circuit with IET-TFETs exhibited a higher operation frequency than that with conventional TFETs. IET technology provides a breakthrough towards realizing complementary circuits with Si-TFETs.


IEEE Transactions on Circuits and Systems Ii-express Briefs | 2017

Fully Integrated, 100-mV Minimum Input Voltage Converter with Gate-Boosted Charge Pump Kick-Started by LC Oscillator For Energy Harvesting

Hiroshi Fuketa; Shin-ichi O’uchi; Takashi Matsukawa

A fully integrated step-up dc–dc converter for energy harvesting applications is presented. A minimum start-up voltage of 100 mV is achieved by the start-up mechanism based on an LC oscillator (LCO). Conventional voltage converters with the LCO-based start-up mechanism provide a significantly low conversion efficiency of around 1%. To overcome this drawback, the following two circuit techniques are proposed in this brief: 1) a gate-boosted charge pump; and 2) an LCO deactivation. The proposed voltage converter is fabricated in the 65-nm silicon-on-thin-buried-oxide process. The measurement results show that when the input voltage is 100 mV, the proposed converter can provide an output of 760 mV at a conversion efficiency of 33%, which is the highest efficiency compared with the conventional fully integrated voltage converters.


international solid-state circuits conference | 2017

Session 15 overview: Innovations in technologies and circuits

Jan Genoe; Hiroshi Fuketa; Eugenio Cantatore

This session covers a diverse set of novel technologies and circuits. The first 3 papers of this session implement circuits in large area technologies. Subsequent papers describe optical beam steering, interfaces to scalable quantum computing, ultra-high-resolution gravimetric mass sensing using NEMS arrays, dopamine sensing using graphene electrodes, 4F2 X-point technologies for archive systems, and integrated photonic crystals for physically unclonable functions (PUFs).


IEEE Transactions on Circuits and Systems Ii-express Briefs | 2017

A 0.3-V 1-

Hiroshi Fuketa; S. O'uchi; Takashi Matsukawa

This brief presents an ultralow-power wake-up receiver using ultrasound for Internet of Things applications. To achieve both high sensitivity and low power consumption, we propose a Colpitts-oscillator-based super-regenerative receiver (COSR). Owing to the simple architecture of the proposed COSR, a lowest supply voltage operation of 0.3 V and a smallest area are achieved. Furthermore, the power consumption of the proposed wake-up receiver is scalable and is determined by the input signal sensitivity and data rate, which are configurable by the user. In a field test, the proposed wake-up receiver consumes


Materials Science in Semiconductor Processing | 2017

\mu \text{W}

Shintaro Otsuka; Takahiro Mori; Yukinori Morita; Noriyuki Uchida; Yongxun Liu; S. O'uchi; Hiroshi Fuketa; Shinji Migita; Meishoku Masahara; Takashi Matsukawa

1~\mu \text{W}


The Japan Society of Applied Physics | 2017

Super-Regenerative Ultrasound Wake-Up Receiver With Power Scalability

Yukinori Morita; Koichi Fukuda; Yongxun Liu; Takahiro Mori; Wataru Mizubayashi; S. O'uchi; Hiroshi Fuketa; Shintaro Otsuka; Shinji Migita; Meishoku Masahara; Kazuhiko Endo; Hiroyuki Ota; Takashi Matsukawa

, which is smaller by 77% than that of a conventional ultrasound wake-up receiver at a comparable communication distance and data rate.


Solid-state Electronics | 2017

Epitaxial growth of Ge thin film on Si (001) by DC magnetron sputtering

Takashi Matsukawa; Yongxun Liu; Takahiro Mori; Yukinori Morita; Shintaro Otsuka; S. O'uchi; Hiroshi Fuketa; Shinji Migita; Meishoku Masahara


IEEE Transactions on Very Large Scale Integration Systems | 2017

Tunnel FinFET CMOS Inverter for Ultra-Low Power IoT Application

Hiroshi Fuketa; S. O'uchi; Takashi Matsukawa


The Japan Society of Applied Physics | 2016

Impact of residual defects caused by extension ion implantation in FinFETs on parasitic resistance and its fluctuation

Shintaro Otsuka; Takahiro Mori; Yukinori Morita; Noriyuki Uchida; Yongxun Liu; S. O'uchi; Hiroshi Fuketa; Shinji Migita; M. Masahara; Takashi Matsukawa

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Takashi Matsukawa

National Institute of Advanced Industrial Science and Technology

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S. O'uchi

National Institute of Advanced Industrial Science and Technology

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Shinji Migita

National Institute of Advanced Industrial Science and Technology

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Takahiro Mori

National Institute of Advanced Industrial Science and Technology

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Yukinori Morita

National Institute of Advanced Industrial Science and Technology

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Yongxun Liu

National Institute of Advanced Industrial Science and Technology

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Meishoku Masahara

National Institute of Advanced Industrial Science and Technology

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Shintaro Otsuka

National Institute of Advanced Industrial Science and Technology

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Koichi Fukuda

National Institute of Advanced Industrial Science and Technology

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Wataru Mizubayashi

National Institute of Advanced Industrial Science and Technology

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