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Dive into the research topics where James A. Busby is active.

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Featured researches published by James A. Busby.


electronic components and technology conference | 2007

C4NP Technology for Lead Free Solder Bumping

Eric Laine; Eric D. Perfecto; Barrie C. Campbell; James Wood; James A. Busby; John J. Garant; Luc Guerin

C4NP is a novel solder bumping technology developed by IBM that addresses the limitations of existing bumping technologies by enabling low-cost, fine pitch bumping using a variety of lead-free solder alloys. It is a solder transfer technology where molten solder is injected into pre-fabricated and reusable glass molds. The glass mold contains etched cavities which mirror the bump pattern on the wafer. Filled mold and wafer are brought into close proximity/soft contact at reflow temperature and solder bumps are transferred onto the entire 300 mm (or smaller) wafer in a single process step without the complexities associated with liquid flux. The simplicity of the process makes it a low cost, high yield and fast cycle time solution for bumping with a variety of high performance lead free alloys. The focus of this paper is on the mold fabrication, solder fill and inspection steps prior to solder transfer including high volume manufacturing tool designs. Yield improvements from the mold suppliers and mold specs are discussed. Finally, the results from a detailed cost model are reviewed. This cost model includes a comparison of C4NP versus alternative bumping techniques and includes capital, materials, and labor cost factors. The data in this paper are provided by the IBM Systems and Technology Group in the Hudson Valley Research Park, NY.


Archive | 2007

Sandwiched organic lga structure

William L. Brodsky; James A. Busby; Bruce J. Chamberlin; Mitchell G. Ferrill; David L. Questad; Robin A. Susko


Archive | 2001

Electrical coupling of substrates by conductive buttons

Brian Samuel Beaman; William L. Brodsky; James A. Busby; Benson Chan; Voya R. Markovich; Charles Hampton Perry


Archive | 2015

Tamper-respondent assemblies with enclosure-to-board protection

William L. Brodsky; James A. Busby; Edward N. Cohen; Silvio Dragone; Michael J. Fisher; David C. Long; Michael T. Peets; William Santiago-Fernandez; Thomas Weiss


Archive | 2015

TAMPER-RESPONDENT ASSEMBLIES WITH BOND PROTECTION

William L. Brodsky; James A. Busby; Zachary T. Dreiss; Michael J. Fisher; David C. Long; William Santiago-Fernandez; Thomas Weiss


Archive | 2017

CIRCUIT LAYOUTS OF TAMPER-RESPONDENT SENSORS

William L. Brodsky; James A. Busby; Edward N. Cohen; Phillip Duane Isaacs


Archive | 2001

Built-in inspection template for a printed circuit

Marshall L. Brown; James A. Busby; Raymond A. Phillips; John A. Potenza; Jirina D. Shupp; J. Robert Young


Archive | 2008

OPTIMIZATION OF METALLURGICAL PROPERTIES OF A SOLDER JOINT

James A. Busby; Minhua Lu; Valerie Oberson; Eric D. Perfecto; Kamalesh K. Srivastava; Brian R. Sundlof; Julien Sylvestre; Renee L. Weisman


Archive | 2005

Temperature dependent semiconductor module connectors

William L. Brodsky; James A. Busby; Bruce J. Chamberlin; Mitchell G. Ferrill; Robin A. Susko; James R. Wilcox


Archive | 2015

Tamper-respondent assemblies

William L. Brodsky; James A. Busby; Phillip Duane Isaacs; David C. Long

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