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Featured researches published by Kurt Knorpp.


international solid state circuits conference | 1993

A 9-ns 16-Mb CMOS SRAM with offset-compensated current sense amplifier

Katsunori Seno; Kurt Knorpp; Lee-Lean Shu; Naoki Teshima; Hiroki Kihara; Hiroshi Sato; Fumio Miyaji; Minoru Takeda; Masayoshi Sasaki; Yoichi Tomo; Patrick Chuang; Kazuyoshi Kobayashi

A 9-ns 16-Mb CMOS SRAM has been developed using a 0.35- mu m CMOS process, The current-mode fully nonequalized data path has been realized in a CMOS SRAM for the first time by using a stabilized feedback current-sense amplifier (SFCA) that provides a small input resistance and an offset compensation effect. To reduce the test time, a bit-line wired-OR parallel test circuit has been implemented. >


international solid-state circuits conference | 1993

A 9 ns 16 Mb CMOS SRAM with offset reduced current sense amplifier

Katsunori Seno; Kurt Knorpp; Lee-Lean Shu; Fumio Miyaji; M. Sasaki; Minoru Takeda; T. Yokoyama; K. Fujita; T. Kimura; Yoichi Tomo; Patrick Chuang; K. Kobayashi

A 4-Mb*4 SRAM (static random access memory) with a 9-ns access time that uses a 0.35- mu m CMOS process with KrF excimer laser lithography is descibed. The 9-ns access time is achieved by using a current-mode nonequalized read data path with an offset-reduced stabilized-feedback current sense amplifier and a quadrant-organization architecture. The design includes a current-mode wired-OR 64-b*4 parallel test circuit. The typical address access time is 9 ns at a supply voltage of 3.3 V and an output load capacitance of 30 pF. Active current is 72 mA at 30 MHz under typical conditions.<<ETX>>


IEEE Journal of Solid-state Circuits | 2014

A Fast-Lock, Jitter Filtering All-Digital DLL Based Burst-Mode Memory Interface

Masum Hossain; Farrukh Aquil; Pak Shing Chau; Brian Tsang; Phuong Le; Jason Wei; Teva Stone; Barry Daly; Chanh Tran; Kurt Knorpp; Jared L. Zerbe

A 800 Mb/s to 3.2 Gb/s memory interface is designed that achieves 30% improved energy efficiency by eliminating idle mode power completely. The link is similar to a standard DDR architecture with the addition of a fast-lock DLL on the memory side that wakes up from 0 mW and locks within 3 clock cycles consuming 24 mW with residual timing error less than 33 mUI. Following initial lock, the DLL operates in a closed loop to compensate for V,T drift consuming 6 mW @ 1.6 GHz including a replica buffer. By incorporating an injection locked oscillator inside the loop, the DLL provides PLL like high frequency input jitter filtering, and corrects ±10% DCD without an additional duty cycle correction loop.


Archive | 2005

Impedance controlled output driver

Donald C. Stark; Jun Kim; Kurt Knorpp; Michael Tak-Kei Ching; Natsuki Kushiyama


Archive | 2004

Integrated circuit memory system having dynamic memory bank count and page size

Steven C. Woo; Michael Ching; Chad A. Bellows; Wayne S. Richardson; Kurt Knorpp; Jun Kim


Archive | 2001

Charge compensation control circuit and method for use with output driver

Donald C. Stark; Jun Kim; Kurt Knorpp; Michael Tak-Kei Ching; Natsuki Kushiyama


Archive | 2004

Dram output circuitry supporting sequential data capture to reduce core access times

Chad A. Bellows; Wayne S. Richardson; Lawrence Lai; Kurt Knorpp


Archive | 1994

Current mode test circuit for SRAM

Lee-Lean Shu; Kurt Knorpp; Katsunori Seno


Archive | 1992

Method of testing redundant memory cells

Katsunori Seno; Kurt Knorpp


Archive | 1992

SRAM with current-mode read data path

Lee-Lean Shu; Kurt Knorpp; Katsunori Seno

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