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Publication
Featured researches published by Lawrence K. Lange.
vlsi test symposium | 1993
Stephen M. Dunn; D. G. Balazich; Lawrence K. Lange; Charlotte C. Montillo
Details a pattern generator card used in a high speed VLSI test system, a software emulation of that card, and card debug procedure. The Advanced Test System built at IBM East Fishkill contains primarily pin electronics cards, pattern generator cards, and power and clock distribution cards. The software emulator, called PGEM, for pattern generator emulation, serves two major purposes: it facilitates off-line debug of pattern generator cards; and, when used with a waveform tool, it permits verification of test programs without wasting system time. The simplification of off-line debug is important in terms of time savings and reduction of expensive incorrect diagnoses.<<ETX>>
Archive | 2004
Patrick M. Williams; Ee K. Cho; David J. Hathaway; Mei-Ting Hsu; Lawrence K. Lange; Gregory A. Northrop; Chandramouli Visweswariah; Cindy Washburn; Jun Zhou
Archive | 1984
Frederick J. Aichelmann; Lawrence K. Lange
Microelectronics Reliability | 1985
Frederick J. Aichelmann; Lawrence K. Lange
Archive | 2003
David J. Hathaway; Lawrence K. Lange; Chandramouli Visweswariah; Patrick M. Williams
Archive | 2000
Timothy J. Koprowski; Mary P. Kusko; Lawrence K. Lange; Bryan J. Robbins
Archive | 1982
Frederick J. Aichelmann; Lawrence K. Lange
Archive | 1972
Chester Chih-Kung Chao; Lawrence K. Lange; Eric Lindbloom; Anil Dattatraya Savkar
Archive | 2007
Reinaldo A. Bergamaschi; Sean M. Carey; Brian W. Curran; Prabhakar Kudva; Lawrence K. Lange; Matthew E. Mariani; Mark D. Mayo; Ruchir Puri; Gebhard Weber
Archive | 1985
Frederick J. Aichelmann; Lawrence K. Lange