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Dive into the research topics where Lawrence K. Lange is active.

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Featured researches published by Lawrence K. Lange.


vlsi test symposium | 1993

Pattern generator card, emulation, and debug

Stephen M. Dunn; D. G. Balazich; Lawrence K. Lange; Charlotte C. Montillo

Details a pattern generator card used in a high speed VLSI test system, a software emulation of that card, and card debug procedure. The Advanced Test System built at IBM East Fishkill contains primarily pin electronics cards, pattern generator cards, and power and clock distribution cards. The software emulator, called PGEM, for pattern generator emulation, serves two major purposes: it facilitates off-line debug of pattern generator cards; and, when used with a waveform tool, it permits verification of test programs without wasting system time. The simplification of off-line debug is important in terms of time savings and reduction of expensive incorrect diagnoses.<<ETX>>


Archive | 2004

Method for tuning a digital design for synthesized random logic circuit macros in a continuous design space with optional insertion of multiple threshold voltage devices

Patrick M. Williams; Ee K. Cho; David J. Hathaway; Mei-Ting Hsu; Lawrence K. Lange; Gregory A. Northrop; Chandramouli Visweswariah; Cindy Washburn; Jun Zhou


Archive | 1984

Error correction for multiple bit output chips

Frederick J. Aichelmann; Lawrence K. Lange


Microelectronics Reliability | 1985

Method for storing data words in fault tolerant memory to recover uncorrectable errors

Frederick J. Aichelmann; Lawrence K. Lange


Archive | 2003

Method of optimizing and analyzing selected portions of a digital integrated circuit

David J. Hathaway; Lawrence K. Lange; Chandramouli Visweswariah; Patrick M. Williams


Archive | 2000

Method and apparatus for programmable LBIST channel weighting

Timothy J. Koprowski; Mary P. Kusko; Lawrence K. Lange; Bryan J. Robbins


Archive | 1982

Memory address permutation apparatus

Frederick J. Aichelmann; Lawrence K. Lange


Archive | 1972

Fault simulation system for determining the testability of a non-linear integrated circuit by an electrical signal test pattern

Chester Chih-Kung Chao; Lawrence K. Lange; Eric Lindbloom; Anil Dattatraya Savkar


Archive | 2007

System to Identify Timing Differences from Logic Block Changes and Associated Methods

Reinaldo A. Bergamaschi; Sean M. Carey; Brian W. Curran; Prabhakar Kudva; Lawrence K. Lange; Matthew E. Mariani; Mark D. Mayo; Ruchir Puri; Gebhard Weber


Archive | 1985

Error correction method and system for multiple bit output chips

Frederick J. Aichelmann; Lawrence K. Lange

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