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Dive into the research topics where M. Haykel Ben Jamaa is active.

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Featured researches published by M. Haykel Ben Jamaa.


design, automation, and test in europe | 2009

Novel library of logic gates with ambipolar CNTFETs: opportunities for multi-level logic synthesis

M. Haykel Ben Jamaa; Kartik Mohanram; Giovanni De Micheli

This paper exploits the unique in-field controllability of the device polarity of ambipolar carbon nanotube field effect transistors (CNTFETs) to design a technology library with higher expressive power than conventional CMOS libraries. Based on generalized NOR-NAND-AOI-OAI primitives, the proposed library of static ambipolar CNTFET gates efficiently implements XOR functions, provides full-swing outputs, and is extensible to alternate forms with area-performance tradeoffs. Since the design of the gates can be regularized, the ability to functionalize them in-field opens opportunities for novel regular fabrics based on ambipolar CNTFETs. Technology mapping of several multi-level logic benchmarks - including multipliers, adders, and linear circuits-indicates that on average, it is possible to reduce both the number of gates and area by ~ 38% while also improving performance by 6.9times.


design automation conference | 2009

Decoding nanowire arrays fabricated with the multi-spacer patterning technique

M. Haykel Ben Jamaa; Yusuf Leblebici; Giovanni De Micheli

Silicon nanowires are a promising solution to address the increasing challenges of fabrication and design at the future nodes of the complementary metal-oxide-semiconductor (CMOS) technology roadmap. Despite the attractive opportunity that offers their organization onto regular crossbars, the problem of designing the nanowire decoder is still challenging and highly dependent on the nanowire fabrication technology. In this paper, we introduce a novel design style and encoding scheme for decoding nanowires fabricated with the multi-spacer-patterning technique (MSPT); and we present a method based on gray codes that reduces the fabrication cost and improves the decoder reliability. We show that by arranging the code in a Gray code fashion, we decrease the fabrication complexity by 17% and the variability by 18% on average. By optimizing the decoder parameters, the simulations showed an improvement of the crossbar yield by 40% and a reduction of the effective bit area by 51% to 169 nm2.


international symposium on nanoscale architectures | 2010

Regular fabric design with ambipolar CNTFETs for FPGA and structured ASIC applications

Michele De Marchi; M. Haykel Ben Jamaa; Giovanni De Micheli

In this paper, we propose for the first time the application of ambipolar CNTFETs with in-field controllable polarities to design regular fabrics with static logic. We exploit the high expressive power provided by complementary static logic built with ambipolar CNTFETs to design compact and efficient configurable gates. After evaluating a polarity-aware logic design for the configurable gates, we selected a number of gates with an And-Or-Inverter structure and produced a first comparison with existent medium-grained logic blocks, like the Actel ACT1 and 4-input LUTs [1]. Preliminary evaluation of our gates indicates improvements of around 47% over the ACT1 and of about 18× with respect to 4-input LUTs in terms of area×normalized delay.


china semiconductor technology international conference | 2011

FPGA Design with Double-Gate Carbon Nanotube Transistors

M. Haykel Ben Jamaa; Pierre-Emmanuel Gaillardon; Sébastien Fregonese; Michele De Marchi; Giovanni De Micheli; Thomas Zimmer; Ian O'Connor; Fabien Clermidy

Double-gate carbon nanotube field effect transistors (DGCNTFETs) are novel devices showing an interesting property allowing to control the p- or n-type behavior during the device operation. This opens up the opportunity for novel design paradigms. Based on a compact physical model of these devices, we demonstrate the benefit of designing field-programmable gate arrays (FPGAs) using fine-grain DG-CNTFET logic blocs rather than traditional look-up tables and coarse-grain DG-CNTFET logic blocs. In particular, we show a reduction by 13% to 48% on average in terms of delay of FPGA benchmarks.


design, automation, and test in europe | 2010

Power consumption of logic circuits in ambipolar carbon nanotube technology

M. Haykel Ben Jamaa; Kartik Mohanram; Giovanni De Micheli

Ambipolar devices have been reported in many technologies, including carbon nanotube field effect transistors (CNTFETs). The ambipolarity can be in-field controlled with a second gate, enabling the design of generalized logic gates with a high expressive power, i.e., the ability to implement more functions with fewer physical resources. Reported circuit design techniques using generalized logic gates show an improvement in terms of area and delay with respect to conventional CMOS circuits. In this paper, we characterize and study the power dissipation of generalized logic gates based on am-bipolar CNTFETs. Our results show that the logic gates in the generalized CNTFET library dissipate 28% less power on average than a library of conventional CMOS gates. Further, we also perform logic synthesis and technology mapping, demonstrating that synthesized circuits mapped with the library of ambipolar logic gates dissipate 57% less power than CMOS circuits. By combining the benefits coming from the expressive power of generalized logic and from the CNTFET technology, we demonstrate that we can reduce the energy-delay-product by a factor of 20× using the ambipolar CNTFET technology.


international conference on electronics, circuits, and systems | 2010

Synthesis of regular computational fabrics with ambipolar CNTFET technology

Michele De Marchi; Shashikanth Bobba; M. Haykel Ben Jamaa; Giovanni De Micheli

In this paper, we report on a physical design of regular fabrics with ambipolar CNTFET devices. Three medium-grain size cells, built with ambipolar CNTFETs with in-field controllable polarities are evaluated. We designed regular layouts using these cells using 32nm technology rules and we performed technology mapping and routing of a set of benchmark circuits. CNTFET-based cells were then compared with an existent configurable cell of similar grain size, the Actel ACT1 logic brick, simulated with a 32nm MOSFET model. We obtained delays about 2× better than those obtained with ACT1 after normalization to the intrinsic technology delay. After technology mapping and routing steps, we report performances about 8× better in terms of area × normalized delay for the CNTFET-based cells over the Actel ACT1 cell.


international symposium on circuits and systems | 2010

Characterization of memristive Poly-Si Nanowires via empirical physical modelling

Nikolaos Archontas; Julius Georgiou; M. Haykel Ben Jamaa; Sandro Carrara; Giovanni De Micheli

Memristors are passive circuit elements that behave as resistors with memory. The recently illustrated experimental realization of memristive behaviour of Polysilicon Nanowires has triggered interest in this concept, which is promising to a wide variety of application areas that include neuromorphic circuits. In order to progress with practical implementations that use this technology we need to expand our understanding of the conduction mechanisms in these structures and of the underlying relationship between device behavior and process manufacturing parameters. In this paper we explore these mechanisms through detailed simulation, which includes model calibration and correlation with experimental results. Through fitting of the test results we identify a unique set of density of states that characterize the particular technology implemented.


asia and south pacific design automation conference | 2009

A stochastic perturbative approach to design a defect-aware thresholder in the sense amplifier of crossbar memories

M. Haykel Ben Jamaa; David Atienza; Yusuf Leblebici; Giovanni De Micheli

The use of nanowire crossbars to build devices with large storage capabilities is a very promising architectural paradigm for forthcoming nanoscale memory devices. However, this new type of memory devices raises questions regarding how to test their correct operation. In particular, the variability affecting the decoder is expected to make very complex the test of these new devices. In this paper we present a method to simplify the test of these new devices by using a current thresholder to detect badly addressed nanowires. In the proposed method, the thresholder design is based on a stochastic and perturbative model of the current through the nanowires. Thus, the calculated thresholder parameters are robust against technology variation. As our experimental results indicate, the thresholder error probability is initially only ~ 10-4, which can be also reduced further (up to ~ 60×) by trading-off only ~ 35% area overhead in the memory.


Nanoelectronic Circuit Design | 2011

Reliable Circuits Design with Nanowire Arrays

M. Haykel Ben Jamaa; Giovanni De Micheli

The emergence of different fabrication techniques of silicon nanowires (SiNWs) raises the question of finding a suitable architectural organization of circuits based on them. Despite the possibility of building conventional CMOS circuits with SiNWs, the ability to arrange them into regular arrays, called crossbars, offers the opportunity to achieve higher integration densities. In such arrays, molecular switches or phase-change materials are grafted at the crosspoints, i.e., the crossing nanowires, in order to perform computation or storage. Given the fact that the technology is not mature, a hybridization of CMOS circuits with nanowire arrays seems to be the most promising approach.


international conference on nanotechnology | 2009

Fabrication of memristors with poly-crystalline silicon nanowires

M. Haykel Ben Jamaa; Sandro Carrara; Julius Georgiou; Nikolaos Archontas; Giovanni De Micheli

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Giovanni De Micheli

École Polytechnique Fédérale de Lausanne

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Michele De Marchi

École Polytechnique Fédérale de Lausanne

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David Atienza

École Polytechnique Fédérale de Lausanne

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Sandro Carrara

École Polytechnique Fédérale de Lausanne

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Yusuf Leblebici

École Polytechnique Fédérale de Lausanne

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Nikolaos Archontas

Democritus University of Thrace

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Federico Angiolini

École Polytechnique Fédérale de Lausanne

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