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Dive into the research topics where Magali De Matos is active.

Publication


Featured researches published by Magali De Matos.


IEEE Journal of the Electron Devices Society | 2015

Source-Pull and Load-Pull Characterization of Graphene FET

Sebastien Fregonese; Magali De Matos; David Mele; Cristell Maneux; Henri Happy; Thomas Zimmer

This paper presents the characterization of a GFET transistor using a source-pull/load-pull test set. The characterization shows that despite the good fT and fMAX, it is hard to achieve power gain using the GFET device within a circuit configuration. This is due to the very high impedance at the gate making impedance matching at the input extremely difficult. S-parameter characterization is performed and the associated small signal model is developed in order to further analyse and extrapolate the source-pull and load-pull measurement results. A good agreement is observed between small signal model simulation results and source-pull/load-pull measurements. Finally, the model is used to evaluate the optimum power gain of the transistor in a circuit configuration under matched conditions.


international new circuits and systems conference | 2015

Substrate-coupling effect in BiCMOS technology for millimeter wave applications

Sebastien Fregonese; Rosario D'Esposito; Magali De Matos; Andreas Kohler; Cristell Maneux; Thomas Zimmer

This paper presents a detailed analysis of substrate coupling effects. Two types of coupling are considered. (i) Coupling from the device to the substrate and (ii) coupling between two neighboring devices. To assess the substrate coupling effect, specific test-structures have been designed for the mmW characterization. Various devices dimensions and distance between two neighboring devices have been fabricated for investigation. In addition, the associated deembedding structures have also been added on the test-structure such as the open, short, open and open-pad structures. Finally, S parameters measurements are performed up to 110 GHz and the substrate-coupling is investigated. To validate the analysis, Sentaurus TCAD simulations are used. A comparison between the S-parameters measurements and TCAD results is given. Finally, a scalable compact model based on lumped elements is proposed for the circuit design in the sub-THz range.


international symposium on circuits and systems | 2015

Graphene FET evaluation for RF and mmWave circuit applications

Sebastien Fregonese; Jorgue Daniel Aguirre Morales; Magali De Matos; Cristell Maneux; Thomas Zimmer

This letter presents the characterisation of a GFET transistor with a source-pull/load-pull test bench. The characterisation shows that despite the good fT and fMAX, it is hard to achieve reasonable power gain using the GFET device in a circuit configuration. This is due to the very high impedance at the gate making impedance matching at the input extremely difficult. An electrical model is used to evaluate the optimum power gain of the transistor under matched conditions. In a second part, a benchmarking of the technology is realized through accurate simulation of an optimised GFET device. Based on this input data, a compact model permits the evaluation of the GFET for high frequency amplifications.


IEEE Transactions on Microwave Theory and Techniques | 2018

On-Wafer Characterization of Silicon Transistors Up To 500 GHz and Analysis of Measurement Discontinuities Between the Frequency Bands

Sebastien Fregonese; Magali De Matos; Marina Deng; Manuel Potéreau; Cédric Ayela; Klaus Aufinger; Thomas Zimmer

This paper investigates on-wafer characterization of SiGe HBTs up to 500 GHz. Test structures for on-wafer thru-reflect-line (TRL) calibration have been designed and are presented. The TRL calibration method with silicon standards has first been benchmarked through electromagnetic simulation. Passive and active components are then characterized up to 500 GHz. The slight discontinuities between the frequency bands are explored. A specific focus was placed on incorrect horizontal probe positioning as well as on probe deformation, resulting in a better assessment of possible measurement errors.


International Journal of Microwave and Wireless Technologies | 2016

On the development of a novel high VSWR programmable impedance tuner

Arnaud Curutchet; Anthony Ghiotto; Manuel Potéreau; Magali De Matos; Sebastien Fregonese; Eric Kerherve; Thomas Zimmer

Impedance tuners are key instruments used for load- and source–pull measurements. They are crucial for any active microwave components, circuits, and systems characterization and optimization. This paper reports theoretical, simulated, and experimental results related to the development of a novel programmable impedance tuner offering high-voltage standing wave ratio (VSWR). After presenting the proposed tuner principle, a fabricated prototype operating at microwave frequencies and based on a 3.5 mm coaxial line is introduced with experimental results. Depending on the targeted frequency band, different pairs of slugs, with optimized length and characteristic impedance, can be used to obtain an optimal VSWR. This first prototype allowed us to demonstrate the interest of the proposed impedance synthesis principle and to identify ways forward to further improve its performances and push forward this promising technology.


Journal of Electronic Testing | 2007

A Robust 130 nm-CMOS Built-In Current Sensor Dedicated to RF Applications

M. Cimino; Hervé Lapuyade; Magali De Matos; Thierry Taris; Yann Deval; Jean-Baptiste Begueret


Journal of Computational Chemistry | 2013

Limitations of On-Wafer Calibration and De-Embedding Methods in the Sub-THz Range

Manuel Potéreau; Christian Raya; Magali De Matos; Sebastien Fregonese; Arnaud Curutchet; Min Zhang; Bertrand Ardouin; Thomas Zimmer


radio frequency integrated circuits symposium | 2018

A 31 GHz 2-Stage Reconfigurable Balanced Power Amplifier with 32.6dB Power Gain, 25.5% PAE max and 17.9dBm P sat in 28nm FD-SOI CMOS

Florent Torres; Magali De Matos; Andreia Cathelin; Eric Kerherve


international conference on microelectronic test structures | 2018

Importance of complete characterization setup on on-wafer TRL calibration in sub-THz range

Chandan Yadav; Marina Deng; Magali De Matos; Sebastien Fregonese; Thomas Zimmer


mediterranean microwave symposium | 2017

Design of Silicon On-Wafer Sub-THz Calibration Kit

Marina Deng; Sebastien Fregonese; Didier Celi; Pascal Chevalier; Magali De Matos; Thomas Zimmer

Collaboration


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Thomas Zimmer

Centre national de la recherche scientifique

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Sebastien Fregonese

Delft University of Technology

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Marina Deng

University of Bordeaux

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Yann Deval

University of Bordeaux

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Sebastien Fregonese

Delft University of Technology

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