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Malcolm Grief

Micron Technology

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Publication

Featured researches published by Malcolm Grief.

Archive | 2004

Method and apparatus for testing semiconductor circuitry for operability and method of forming apparatus for testing semiconductor circuitry for operability

Warren M. Farnworth; Malcolm Grief; Gurtej S. Sandhu

Archive | 1995

Method for chemical planarization (CMP) of a semiconductor wafer to provide a planar surface free of microscratches

Trung T. Doan; Malcolm Grief; Laurence D Schultz

Archive | 1994

Testing apparatus for engaging electrically conductive test pads on a semiconductor substrate having integrated circuitry for operability testing thereof

Warren M. Farnworth; Malcolm Grief; Gurtej S. Sandhu

Archive | 1996

Apparatus and method for planar end-point detection during chemical-mechanical polishing

Trung T. Doan; Gurtej S. Sandhu; Malcolm Grief

Archive | 2002

Engagement probe having a grouping of projecting apexes for engaging a conductive pad

Warren M. Farnworth; Malcolm Grief; Gurtej S. Sandhu

Archive | 1990

Electrical contact with diffusion barrier

Malcolm Grief; Trung T. Doan

Archive | 1991

Method to reduce the reflectivity of a semi-conductor metallic surface

Malcolm Grief

Archive | 2000

Engagement probe and apparatuses configured to engage a conductive pad

Warren M. Farnworth; Malcolm Grief; Gurtej S. Sandhu

Archive | 1993

Chemical-mechanical planarising - by turning semiconductor wafer, planarising, and polishing wafer

Trung T. Doan; Malcolm Grief; Laurence D Schultz

Archive | 2001

Methods of forming apparatuses and a method of engaging electrically conductive test pads on a semiconductor substrate

Warren M. Farnworth; Malcolm Grief; Gurtej S. Sandhu

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Collaboration

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Gurtej S. Sandhu

Micron Technology

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Warren M. Farnworth

Micron Technology

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Trung T. Doan

Micron Technology

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Laurence D Schultz

Micron Technology

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