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Dive into the research topics where Manzur Gill is active.

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Featured researches published by Manzur Gill.


international solid-state circuits conference | 2002

A 600-MHz VLIW DSP

Sanjive Agarwala; P. Koeppen; Timothy D. Anderson; Anthony M. Hill; M. Ales; Raguram Damodaran; Lewis Nardini; P. Wiley; Steven Mullinnix; J. Leach; Anthony J. Lell; Manzur Gill; J. Golston; D. Hoyle; Arjun Rajagopal; Abhijeet Ashok Chachad; M. Agarwala; R. Castille; N. Common; John Apostol; H. Mahmood; Manjeri Krishnan; Duc Quang Bui; Quang-Dieu An; Peter Groves; Luong Nguyen; N.S. Nagaraj; R. Simar

A 600 MHz VLIW DSP, which implements the C64x VelociTI.2/spl trade/ architecture delivers 4800 MIPS, 2400 (16 b) or 4800 (8 b) million multiply accumulates at 0.3 mW/MMAC (16 b). The chip has 64 M transistors and dissipates 718 mW at 600 MHz and 1.2 V, and 200 mW at 300 MHz and 0.9 V. It has an 8-way VLIW DSP core, a 2-level memory system, and 2.4 GB/s I/O bandwidth. The DSP chip is implemented in 0.13 μm CMOS technology with 6-layer copper metalization.


IEEE Journal of Solid-state Circuits | 1991

An experimental 4 Mb flash EEPROM with sector erase

M. Mcconnell; Benjamin H. Ashmore; R. Bussey; Manzur Gill; Sung-Wei Lin; David J. Mcelroy; John F. Schreck; P. Shah; Harvey J. Stiegler; Phat C. Truong; A. L. Esquivel; J. Paterson; B. Riemenschneider

A 512K*8 flash EEPROM (electrically erasable programmable ROM) which operates from a single 5-V supply was designed and fabricated. A double-poly, single-metal CMOS process with a minimum feature size of 0.9 mu m was developed to manufacture the test vehicle, which resulted in a die size of 95 mm/sup 2/. The storage cell is 8.64 mu m/sup 2/ and consists of a one-transistor cell that uses a remote, scalable, tunnel diode for programming and erasing by Fowler-Nordheim tunneling. Process high-voltage requirements are relaxed by utilizing circuit techniques to alleviate the burden of high voltages. A segmented architecture provides the flexibility to erase any one sector (16 kB) or the entire chip during one cycle by an erase algorithm. The memory can be programmed one byte at a time, or the internal bit-line latches can be used to program a 256-B page in one cycle. A programming time of 10 ms is typical, which results in a write time of 40 mu s/B during page programming. The chip features an access time of 90 ns. >


international solid-state circuits conference | 2007

A 65nm C64x+ Multi-Core DSP Platform for Communications Infrastructure

Sanjive Agarwala; Arjun Rajagopal; Anthony M. Hill; M. Joshi; Steven Mullinnix; Timothy D. Anderson; Raguram Damodaran; Lewis Nardini; P. Wiley; P. Groves; John Apostol; Manzur Gill; J. Flores; Abhijeet Ashok Chachad; A. Hales; K. Chirca; K. Panda; R. Venkatasubramanian; P. Eyres; R. Veiamuri; A. Rajaram; Manjeri Krishnan; J. Nelson; J. Frade; M. Rahman; N. Mahmood; U. Narasimha; S. Sinha; S. Krishnan; W. Webster

The combined processing power of three 1+GHz DSP cores and 65nm 7M CMOS integration delivers a WCDMA macro base-station on a single chip. The 300M transistor IC can perform up to 24000MIPS, 8000 16b MMACs per second, coupled with symbol-rate and chip-rate acceleration and dissipates less than 6W.


international solid-state circuits conference | 1989

A 5 V-only 256 kbit CMOS flash EEPROM

S. D'Arrigo; G. Imondi; Giovanni Santin; Manzur Gill; R. Cleavelin; S. Spagliccia; E. Tomassetti; Sung-Wei Lin; A. Nguyen; P. Shah; G. Savarese; D. McElroy

The authors describe a 256-kbit flash EEPROM (electrically erasable and programmable read-only memory) device which requires only 5 V for program, erase, and read operations and has performance and cost comparable to that of the recently reported dual-power-supply flash EEPROMs, which require 12 V for programming and erase and 5 V for read. The memory cell consists of a floating-gate transistor and a merged-pass-gate transistor. The process is array-contactless EEPROM (ACEE), with buried source/drain for the bit lines with a tunnel oxide module and a 20-V CMOS module. The program and erase operations employ the Fowler-Nordheim current tunneled through 100-AA oxide when the proper electrical voltages are applied to the selected bit. The device and technology parameters are summarized.<<ETX>>


Archive | 1991

Segmented, multiple-decoder memory array and method for programming a memory array

Sung-Wei Lin; John F. Schreck; Phat C. Truong; David J. Mcelroy; Harvey J. Stiegler; Benjamin H. Ashmore; Manzur Gill


Archive | 1988

Cross-point contact-free floating-gate memory array with silicided buried bitlines

Manzur Gill; David J. Mcelroy


Archive | 1993

Method of making contract-free floating-gate memory array with silicided buried bitlines and with single-step defined floating gates

Manzur Gill; Howard L. Tigelaar


Archive | 1990

Hot electron programmable, tunnel electron erasable contactless EEPROM

Manzur Gill; Sung-Wei Lin


Archive | 1989

Bit and block erasing of an electrically erasable and programmable read-only memory array

Manzur Gill; Sung-Wei Lin; Iano D'Arrigo; David J. Mcelroy


Archive | 1992

Diffusionless conductor/oxide semiconductor field effect transistor and methods for making and using the same

Manzur Gill

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