Mark W. Michael
Advanced Micro Devices
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Publication
Featured researches published by Mark W. Michael.
18th Annual BACUS Symposium on Photomask Technology and Management | 1998
John L. Nistler; Mark W. Michael; Fred N. Hause; Richard D. Edwards
Data and discussions will be presented on the NTRM, National Technology Roadmap, for reticles based on a Process Integration perception. Specifically two layers are considered for this paper, the gate layer which is primarily a chrome geometry mask with a lot of open glass and a local interconnect layer which is primarily a chrome plate using clear geometries. Information from other sources is used where appropriate and actual in-house data is used to illustrate specific points. Realizing that demands from different customers for specific types of features tend to drive specific mask makers and their decisions on equipment purchases and processes. We attempt to help predict where Integration approaches have either caused a lag in technology pushes or have actually speeded up certain requirements. Discussions of integration requirements, which tend to push maskmakers, will be presented. Along with typical design approaches in OPC and PSM which either will push technology or actually slow down the trend towards smaller geometries. In addition, data will be presented showing how specific stepper characteristics may actually drive the customers criteria, thus changing the requirements from customer to customer.
Microelectronic device technology. Conference | 1997
Bijnan Bandyopadhyay; Jon D. Cheek; Robert Dawson; Michael Duane; Jim Fulford; Mark I. Gardner; Fred N. Hause; Bernard W. K. Ho; Daniel Kadoch; Raymond T. Lee; Ming-Yin Hao; Chuck May; Mark W. Michael; Brad T. Moore; Deepak K. Nayak; John L. Nistler; Dirk Wristers
A family of CMOS processing technologies used to produce AMDs fifth and sixth generation microprocessors (K5 and K6) is described. Some of the issues that arose during the technology development and the transfer to manufacturing are also presented. Transistor performance is compared to literature results and shown to be best in its class.
Archive | 1997
Robert Dawson; Mark W. Michael; Basab Bandyopadhyay; H. Jim Fulford; Fred N. Hause; William S. Brennan
Archive | 1996
H. Jim Fulford; Robert Dawson; Fred N. Hause; Basab Bandyopadhyay; Mark W. Michael; William S. Brennan
Archive | 1997
Mark I. Gardner; Robert Dawson; H. Jim Fulford; Frederick N. Hause; Daniel Kadosh; Mark W. Michael; Bradley T. Moore; Derick J. Wristers
Archive | 1997
Frederick N. Hause; Robert Dawson; H. Jim Fulford; Mark I. Gardner; Mark W. Michael; Bradley T. Moore; Derick J. Wristers
Archive | 1998
Basab Bandyopadhyay; H. Jim Fulford; Robert Dawson; Fred N. Hause; Mark W. Michael; William S. Brennan
Archive | 1997
Robert Dawson; H. Jim Fulford; Mark I. Gardner; Frederick N. Hause; Mark W. Michael; Bradley T. Moore; Derick J. Wristers
Archive | 1997
H. Jim Fulford; Robert Dawson; Mark I. Gardner; Frederick N. Hause; Mark W. Michael; Bradley T. Moore; Derick J. Wristers
Archive | 1996
Robert Dawson; Mark W. Michael; William S. Brennan; Basab Bandyopadhyay; H. Jim Fulford; Fred N. Hause