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Latest external collaboration on country level. Dive into details by clicking on the dots.

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Dive into the research topics where Matthew S. Grady is active.

Publication


Featured researches published by Matthew S. Grady.


Archive | 2002

Method of statistical binning for reliability selection

Tange Nan Barbour; Thomas S. Barnett; Matthew S. Grady; Kathleen G. Purdy


Archive | 2005

Method of adding fabrication monitors to integrated circuit chips

James W. Adkisson; Greg Bazan; John M. Cohn; Matthew S. Grady; Thomas G. Sopchak; David P. Vallett


Archive | 2004

Designing scan chains with specific parameter sensitivities to identify process defects

James W. Adkisson; Greg Bazan; John M. Cohn; Matthew S. Grady; Leendert M. Huisman; Mark D. Jaffe; Phillip J. Nigh; Leah M. P. Pastel; Thomas G. Sopchak; David E. Sweenor; David P. Vallett


Archive | 2001

Method and system for determining common failure modes for integrated circuits

David V. Gangl; Matthew S. Grady; David John Iverson; Kenneth A. Lavallee; Robert Edward Shearer


Archive | 2004

Circuit and method for monitoring defects

Greg Bazan; John M. Cohn; Matthew S. Grady; Phillip J. Nigh; Leah M. P. Pastel; Thomas G. Sopchak


Archive | 2003

METHOD AND SYSTEM FOR DETERMINING MINIMUM POST PRODUCTION TEST TIME REQUIRED ON AN INTEGRATED CIRCUIT DEVICE TO ACHIEVE OPTIMUM RELIABILITY

Tange Nan Barbour; Thomas S. Barnett; Matthew S. Grady; William V. Huott; Michael R. Ouellette


Archive | 2001

System and method to predetermine a bitmap of a self-tested embedded array

David V. Gangl; Matthew S. Grady; David John Iverson; Gary W. Maier; Robert Edward Shearer; Donald L. Wheater


Archive | 2008

Method for monitoring thermal control

Francois Aube; Timothy M. Curtis; Matthew S. Grady; Thomas P. Scanlon; Eric N. Smith


Archive | 2013

Real-time rule engine for adaptive testing of integrated circuits

David E. Atkinson; Matthew S. Grady; Donald L. LaCroix; B. Lutton Ii David; Bradley D. Pepper; Randolph P. Steel


Archive | 2011

INTEGRATED CIRCUIT TEST OPTIMIZATION USING ADAPTIVE TEST PATTERN SAMPLING ALGORITHM

Matthew S. Grady; Mark C. Johnson; Bradley D. Pepper; Dean G. Percy; Joseph C. Pranys

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