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Dive into the research topics where Mian Tao is active.

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Featured researches published by Mian Tao.


ASME 2015 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems collocated with the ASME 2015 13th International Conference on Nanochannels, Microchannels, and Minichannels | 2015

Modeling and Parametric Study of Light Scattering, Absorption and Emission of Phosphor in a White Light-Emitting Diode

Jiaqi Wang; Jeffery C. C. Lo; S. W. Ricky Lee; Feng Yun; Mian Tao

In this study, we proposed and demonstrated an effective approach to model and predict spectral power distribution (SPD) for a phosphor-converted light emitting diode (pc-LED). For emission and excitation, broadband diffuse transmittances of 1 mm YAG:Ce phosphor plates with different concentrations were measured by a spectrophotometer. For emission, it was found that transmittance for all wavelengths was almost identical. This result indicates that emission spectrum prediction could be simplified by simulating the radiant power of the peak wavelength only. At the peak wavelength (560 nm), our simulation results, in which optical constants were calculated by the Lorenz-Mie theory, agreed well with our measurements. For excitation, a novel transmittance measurement setup based on an LED goniophotometer was proposed to obtain the absorption coefficient. By adjusting the optical parameter in our ray-tracing model to fit measured transmittances, accurate absorption coefficients were determined. Based on our calculation and measured optical parameters, we simulated the radiant power of the blue light and yellow light of commercial white LED packages. By expanding the total blue and yellow power into linear combinations of wavelengths in both regions, we successfully predicted the SPD of our LED package. Our predicted SPD has good agreement with the measured results.Copyright


international conference on electronic packaging technology | 2016

Application of Nano Silver sintering technique on the chip bonding for flip-chip and vertical light emitting diodes

Mian Tao; Yun-Hui Mei; S. W. Ricky Lee; Feng Yun; Guo-Quan Lu

The bonding layer in the light emitting diode (LED) device of flip-chip or vertical structure is the most critical part to the device performance since it supports the electrical and thermal interconnection between the chip and its carrier. Therefore, the chip bonding process has become one of the major issues in the practical manufacturing. In this study, we developed a novel bonding technique using silver nano particle sintering. The raw bonding material with silver nano particles is in a paste form similar to the traditional Ag-epoxy. The entire bonding process is almost the same as the Ag-epoxy adhesive bonding. Meanwhile, it can provide excellent thermal and electrical performance better than the Ag-epoxy. Vertical and flip-chip LEDs were both chosen for demonstrating the silver nano particle bonding technique. After the test vehicles were prepared, diverse tests were conducted. The thermal performance was measured by the transient thermal analysis method. The electrical and optical performance were tested by an integrating sphere system. In addition, destructive shear tests were performed in order to characterize the shear strength. From the experimental results, it can be concluded that the silver nano particle sintering technique could be a promising bonding technique based on the assessment of performance, processing, and cost.


international conference on electronic packaging technology | 2013

Experimental characterization of adhesion strength between the silicone encapsulant and the bottom of a SMD LED leadframe cup

Sain H. Y. Zou; Mian Tao; Jeffery C. C. Lo; S. W. Ricky Lee

This paper presents an experimental study on the adhesion strength between the silicone encapsulant and the bottom of the leadframe cup of a 3528 SMD LED. In this study, a new test method was proposed using silicone to mount a piece of dummy silicon chip to the bottom of the leadframe cup. Afterwards, a bond tester was employed to apply the loading on the edge of the dummy silicon chip to shear the silicone underneath. In addition to the characterization of adhesion strength, parametric studies were also performed to investigate the effects of shear height and shear speed on the adhesion strength. Detailed information about sample preparation and experimental procedure will be presented in the paper.


china international forum on solid state lighting | 2013

Thermal characterization of a printed circuit board with thermal vias for the application of high brightness light-emitting diodes

Mian Tao; Zicheng Feng; John Swanson; John Ganjei; Jeffery C. C. Lo; S. W. Ricky Lee

The power of state-of-art LED has been substantially raised for the continuous demand of high lumen output. Limited by the overall efficiency, at least 70% of the total input power would be transformed into heat. As a result, thermal management gained more and more attention. For the sake of reducing the material cost and also further improving the thermal performance, the FR-4 printed circuit board (PCB) cooperating with thermal via as the alternative of metal core PCB (MC-PCB) is attracting more and more attentions. In this study, the LED devices using thermal via for heat dissipation were fabricated and characterized. By means of the transient thermal characterization, the thermal performances of these devices were estimated. Firstly, the thermal resistance of the LED component was achieved through the dual thermal interface method by surface mounting the components with two types of soldering materials of different thermal conductivities. Then, the junction temperatures and the structure function of every sample were measured and the corresponding thermal resistances of their PCBs were obtained. Through the comparison among all the samples, it can be observed that the FR-4 PCB with fully filled thermal via showed a prominent thermal performance better than the MC-PCB.


Journal of microelectronics and electronic packaging | 2017

Fan-Out Wafer-Level Packaging (FOWLP) of Large Chip with Multiple Redistribution Layers (RDLs)

John H. Lau; Ming Li; Nelson Fan; Eric Kuah; Zhang Li; Kim Hwee Tan; Tony Chen; Iris Xu; Margie Li; Yiu Ming Cheung; Wu Kai; Ji Hao; Rozalia Beica; Tom Taylor; Cheng-Ta Ko; Henry Yang; Yu-Ting Chen; Sze Pei Lim; Nc Lee; Jiang Ran; Koh Sau Wee; Qingxiang Yong; Cao Xi; Mian Tao; Jeffery C. C. Lo; Ricky Shi Wei Lee


IEEE Transactions on Components, Packaging and Manufacturing Technology | 2018

Chip-First Fan-Out Panel-Level Packaging for Heterogeneous Integration

Cheng-Ta Ko; Henry Yang; John H. Lau; Ming Li; Margie Li; Curry Lin; Jw Lin; Tony Chen; Iris Xu; Chieh-Lin Chang; Jhih-Yuan Pan; Hsing-Hui Wu; Qing Xiang Yong; Nelson Fan; Eric Kuah; Zhang Li; Kim Hwee Tan; Yiu Ming Cheung; Eric Ng; Wu Kai; Ji Hao; Rozalia Beica; Marc Lin; Yu-Hua Chen; Zhong Cheng; Koh Sau Wee; Jiang Ran; Cao Xi; Sze Pei Lim; Nc Lee


international conference on electronics packaging | 2018

Solderability evaluation of printed silver solder pad for wafer-level packaging

Mian Tao; Jeffery C. C. Lo; Ying-Hong Liou; Peter Chiu; S. W. Ricky Lee


electronic components and technology conference | 2018

Reliability of Fan-Out Wafer-Level Packaging with Large Chips and Multiple Re-Distributed Layers

John H. Lau; Ming Li; Lei Yang; Margie Li; Qing Xiang Yong; Zhong Cheng; Tony Chen; Iris Xu; Nelson Fan; Eric Kuah; Zhang Li; Kim Hwee Tan; Yiu Ming Cheung; Eric Ng; Penny Lo; Wu Kai; Ji Hao; Rozalia Beica; Koh Sau Wee; Jiang Ran; Cao Xi; Sze Pei Lim; Nc Lee; Cheng-Ta Ko; Henry Yang; Yh Chen; Mian Tao; Jeffery C. C. Lo; Ricky Shi Wei Lee


IEEE Transactions on Components, Packaging and Manufacturing Technology | 2018

Fan-Out Wafer-Level Packaging for Heterogeneous Integration

John H. Lau; Ming Li; Margie Li Qingqian; Tony Chen; Iris Xu; Qing Xiang Yong; Zhong Cheng; Nelson Fan; Eric Kuah; Zhang Li; Kim Hwee Tan; Yiu Ming Cheung; Eric Ng; Penny Lo; Wu Kai; Ji Hao; Koh Sau Wee; Jiang Ran; Cao Xi; Rozalia Beica; Sze Pei Lim; Nc Lee; Cheng-Ta Ko; Henry Yang; Yu-Hua Chen; Mian Tao; Jeffery C. C. Lo; Ricky Shi Wei Lee


IEEE Transactions on Components, Packaging and Manufacturing Technology | 2018

Design, Materials, Process, Fabrication, and Reliability of Fan-Out Wafer-Level Packaging

John H. Lau; Ming Li; Qingqian Margie Li; Iris Xu; Tony Chen; Zhang Li; Kim Hwee Tan; Qing Xiang Yong; Zhong Cheng; Koh Sau Wee; Rozalia Beica; Cheng-Ta Ko; Sze Pei Lim; Nelson Fan; Eric Kuah; Wu Kai; Yiu Ming Cheung; Eric Ng; Cao Xi; Jiang Ran; Henry Yang; Yh Chen; Nc Lee; Mian Tao; Jeffery C. C. Lo; Ricky Shi Wei Lee

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Jeffery C. C. Lo

Hong Kong University of Science and Technology

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Cheng-Ta Ko

Industrial Technology Research Institute

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