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Dive into the research topics where Paul E. Luscher is active.

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Featured researches published by Paul E. Luscher.


Journal of Vacuum Science & Technology B | 1996

MxP+: A new dielectric etcher with enabling technology, high productivity, and low cost‐of‐consumables

Hongching Shan; Evans Lee; Michael Welch; Bryan Pu; James D. Carducci; Kuang-Han Ke; Hua Gao; Paul E. Luscher; Gerard Crean; Rynn Wang; Richard Blume; James Cooper; Robert W. Wu

Dielectric etch accounts for more than half of all the dry etches used in integrated circuit (IC) fabrication, and plays a very important role in fulfilling strict requirements of volume‐manufacturing of IC circuits whose feature size is progressively decreasing. The challenge of meeting volume manufacture requirements is what MxP+ has achieved through a series of hardware and process innovations. By Pareto analysis of the wet clean time of the MxP chamber, we were able to define six major drivers to address three key issues: (1) reduce wet clean time, (2) eliminate system complexity, and (3) achieve technical excellence. Key components of the MxP+ that allow us to address them include a quartz gas distribution plate which prevents the aluminum particle formation, and the electrostatic chuck which eliminates the mechanical clamp system while reducing the particle contamination and wafer edge exclusion. The unique chamber liners of the MxP+ not only shield chamber walls, but also provided a wide process wi...


Archive | 2002

Dielectric etch chamber with expanded process window

James D. Carducci; Hamid Noorbakhsh; Evans Lee; Bryan Pu; Hongching Shan; Claes Bjorkman; Siamak Salimian; Paul E. Luscher; Michael Welch


Archive | 2001

Adjusting DC bias voltage in plasma chamber

Hong Ching Shan; Evans Lee; Michael Welch; Robert W. Wu; Bryan Pu; Paul E. Luscher; James D. Carducci; Richard Blume


Archive | 1998

Double slit-valve doors for plasma processing

Michael Welch; Homgqing Shan; Paul E. Luscher; Evans Lee; James D. Carducci; Siamak Salimian


Archive | 2001

Correction of wafer temperature drift in a plasma reactor based upon continuous wafer temperature measurements using and in-situ wafer temperature optical probe

Hamid Norrbakhsh; Mike Welch; Paul E. Luscher; Siamak Salimian; Brad L. Mays


Archive | 1999

Plasma reactor cooled ceiling with an array of thermally isolated plasma heated mini-gas distribution plates

Hamid Noorbakhsh; Michael Welch; Siamak Salimian; Paul E. Luscher; Hongching Shan; Kaushik Vaidya; Jim Carducci; Evans Lee


Archive | 1996

Apparatus and method for actively controlling the DC potential of a cathode pedestal

Richard R. Mett; Mahmoud Dahimene; Paul E. Luscher; Siamak Salimian


Archive | 2001

Apparatus and method for controlling plasma uniformity in a semiconductor wafer processing system

Hongqing Shan; Claes Bjorkman; Paul E. Luscher; Richard R. Mett; Michael Welch


Archive | 2002

Endpoint detection in substrate fabrication processes

Zhifeng Sui; Paul E. Luscher; Nils Johansson; Michael Welch


Archive | 1997

Bandpass photon detector

Zhifeng Sui; Paul E. Luscher

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