Pavel V. Nekrasov

System on module total ionizing dose distribution modeling

The paper presents total ionizing dose (TID) distribution due to trapped electrons and protons at the system on module (SOM) surface. TID calculation was made in 3D_SPACE software (Specialized Electronic Systems). The main goal of this paper is a more precise definition of the radiation hardness requirements for space electronics. A huge TID level dispersion for different ICs in SOM is demonstrated. Basic Al sphere approach for TID spacecraft requirements calculations is shown to provide overestimated conservative results.

Automated radiation test setup for functional and parametrical control of 8-bit microcontrollers

The developed automated setup for functional and parametric control of 8-bit microcontrollers during radiation hardness tests is presented. The setup hardware is based on the NI modular instruments PXI-7841R and PXI-4110 operated under LabVIEW software. Test circuit and methods together with the user software structure and typical test results are presented.

Using modules NI PXI-7841R rapid I/O modulefor the functional control of the microprocessors

The article discusses the use of a NI PXI-7841R module to control the operation of VLSI microprocessors in terms of radiation experiment. The article also discusses the use of the NI PXIe-7962R module in conjunction with the module NI PXI-7841R to expand measurement system possibilities.

Bias conditions and functional test procedure influence on PowerPC7448 microprocessor TID tolerance

TID test method and results for CMOS SOI PowerPC7884 microprocessor in gamma-rays are presented. Significant influence of bias conditions and functional test procedure on resulting TID tolerance level is noted.

Compendium of SEE comparative results under ion and laser irradiation

Compendium of SEU, SEL, SET, SEB and SEGR comparative results under ion irradiation and focused laser beam are presented. The possible sources of discrepancies between ion and laser results and the ways of data correction are discussed.

System-on-chip: Specifics of radiation behavior and estimation of radiation hardness

The analysis results of typical radiation faults of the system-on-chip have been presented. The specifics of digital, analog-to-digital (mixed), and microwave system-on-chip are considered. A set of the basic parameters-criteria for the radiation hardness of system-on-chip of various classes is determined. Methodical and technical designs for controlling the operability of the System-on-chip by carrying out radiation tests are proposed.

Compendium of TID Comparative Results under X-Ray, Gamma and LINAC Irradiation

Compendium of TID comparative results under X-ray, Gamma and LINAC irradiation is presented. The new joint method of X-ray and gamma irradiation employment for TID investigations is proposed. Experiment results successfully confirm the validity of the proposed TID testing approach.

Automated test setup for functional and parametrical control of microcontrollers with internal ADC

The developed automated test setup for microcontrollers with internal analog-to-digital converters is presented. The solution uses PXI-4110 and PXI-7841R modular instruments and LabVIEW software along with individually designed boards. The article also discusses testing methods of the internal digital and analog blocks of microcontrollers, algorithm of ADCs parameters measurement and electromagnetic interference protection during testing.

Investigation of Single Event Functional Interrupts in Microcontoller with PIC17 Architecture

the article is devoted to the study of single event functional interrupts in microprocessors and microcontrollers. SEFI detection method is discussed. The influence of supply voltage, operating frequency and program code on SEFI cross section is examined. In addition the new simplified method of SEFI cross-section calculation based on critical memory space estimation is presented.

Connection of the Parametric and Functional Control for TID Testing of Complex VLSI Circuits

The article describes an original technique for TID testing of complex VLSI circuits (microprocessors) based on combined use of parametric and functional control. The resulting dependences obtained in radiation experiment are qualitatively confirmed by circuit simulation.