Robert Greenwell
University of Tennessee
Network
Latest external collaboration on country level. Dive into details by clicking on the dots.
Publication
Featured researches published by Robert Greenwell.
IEEE Transactions on Electronics Packaging Manufacturing | 2009
Tan Zhang; Zhenwei Hou; R.W. Johnson; L. Del Castillo; Alina Moussessian; Robert Greenwell; Benjamin J. Blalock
Silicon thinned to 50 mum and less is flexible allowing the fabrication of flexible and conformable electronics. Two techniques have been developed to achieve this goal using thinned die: die flip chip bonded onto flexible substrates [polyimide and liquid crystal polymer (LCP)] and die flip chip laminated onto LCP films. A key to achieving each of these techniques is the thinning of die to a thickness of 50 mum or thinner. Conventional grinding and polishing can be used to thin to 50 mum. At 50 mum, the active die becomes flexible and must be handled by temporarily bonding it to a holder die for assembly. Both reflow solder and thermocompression assembly methods are used. In the case of solder assembly, underfill is used to reinforce the solder joints. With thermocompression bonding of the die to an LCP substrate, the LCP adheres to the die surface, eliminating the need for underfill.
applied power electronics conference | 2011
Robert Greenwell; B. M. McCue; Liang Zuo; M. A. Huque; Leon M. Tolbert; Benjamin J. Blalock; Syed K. Islam
The growing demand for hybrid electric vehicles (HEVs) has increased the need for high-temperature electronics that can operate at the extreme temperatures that exist under the hood. This paper presents a high-voltage, high-temperature SOI-based gate driver for SiC FET switches. The gate driver is designed and implemented on a 0.8-micron BCD on SOI process. This gate driver chip is intended to drive SiC power FETs for DC-DC converters and traction drives in HEVs. To this end, the gate driver IC has been successfully tested up to 200ºC. Successful operation of the circuit at this temperature with minimal or no heat sink, and without liquid cooling, will help to achieve higher power-to-volume as well as power-to-weight ratios for the power electronics modules in HEVs.
midwest symposium on circuits and systems | 2008
Chandradevi Ulaganathan; Neena Nambiar; B. Prothro; Robert Greenwell; Suheng Chen; Benjamin J. Blalock; C.L. Britton; M.N. Ericson; H. Hoang; R. Broughton; Kimberly Cornett; Guoyuan Fu; H.A. Mantooth; John D. Cressler; Richard W. Berger
A instrumentation channel has been designed, implemented and tested in a 0.5-mum SiGe BiCMOS process. The circuit features a reconfigurable Wheatstone bridge network that interfaces a range of external sensors to signal processing circuits. Also, analog sampling has been implemented in the channel using a flying capacitor configuration. Measurement results show the instrumentation channel supports input signals up to 200 Hz.
applied power electronics conference | 2013
Robert Greenwell; B. M. McCue; Leon M. Tolbert; Benjamin J. Blalock; Syed K. Islam
High-temperature integrated circuits fill a need in applications where there are obvious benefits to reduced thermal management or where circuitry is placed away from temperature extremes. Examples of these applications include aerospace, automotive, power generation, and well-logging. This work focuses on automotive applications in which the growing demand for hybrid electric vehicles (HEVs), Plug-in-hybrids (PHEVs), and Fuel-cell vehicles (FCVs) has increased the need for high-temperature electronics that can operate at the extreme ambient temperatures that exist under the hood of these vehicles, which can be in excess of 150°C. Silicon carbide (SiC) and other wide-bandgap power switches that can function at these temperature extremes are now entering the market. To take full advantage of their potential, high-temperature capable circuits that can also operate in these environments are required.
IEEE Transactions on Nuclear Science | 2012
K. V. Tham; Chandradevi Ulaganathan; N. Nambiar; Robert Greenwell; C.L. Britton; M.N. Ericson; Jeremy Holleman; Benjamin J. Blalock
A pulse-width locked loop (PWLL) circuit is reported that compensates for process, voltage, and temperature (PVT) variations of a linear ramp generator within a 12-bit multi-channel Wilkinson (single-slope integrating) Analog-to-Digital converter (ADC). This PWLL was designed and fabricated in a 0.5- μm Silicon Germanium (SiGe) BiCMOS process. Simulation and silicon measurement data are shown that demonstrate a large improvement in the accuracy of the PVT-compensated ADC over the uncompensated ADC.
Vlsi Design | 2010
Chandradevi Ulaganathan; Neena Nambiar; Kimberly Cornett; Robert Greenwell; Jeremy A. Yager; Benjamin S. Prothro; Kevin Tham; Suheng Chen; Richard S. Broughton; Guoyuan Fu; Benjamin J. Blalock; C.L. Britton; M. Nance Ericson; H. Alan Mantooth; Mohammad Mojarradi; Richard W. Berger; John D. Cressler
A instrumentation channel has been designed, implemented and tested in a 0.5-mum SiGe BiCMOS process. The circuit features a reconfigurable Wheatstone bridge network that interfaces a range of external sensors to signal processing circuits. Also, analog sampling has been implemented in the channel using a flying capacitor configuration. Measurement results show the instrumentation channel supports input signals up to 200 Hz.
Additional Conferences (Device Packaging, HiTEC, HiTEN, & CICMT) | 2012
B. M. McCue; Robert Greenwell; M.I. Laurence; B.J. Blalock; Syed K. Islam; Leon M. Tolbert
Developments in automotive (particularly hybrid-electric vehicles), aerospace, and energy production industries have led to expanding research interest in integrated circuit (IC) design toward high-temperature applications. A high-voltage, high-temperature silicon-on-insulator (SOI) process allows for circuit design to expand into these extreme environment applications. Nearly all electronic devices require a reliable supply voltage capable of operating under various supply voltages and load currents. These supply voltages and load currents can be either DC or time-varying signals. In this work, a stable supply voltage for embedded circuits is generated on chip via a voltage regulator producing a stable 5-V output voltage. Although applications of this voltage regulator are not limited to gate driver circuits, this regulator has been developed to meet the demands of a gate driver IC. The voltage regulator must be able to provide reliable output voltage over an input range from 10 V to 30 V, a temperature ...
Additional Conferences (Device Packaging, HiTEC, HiTEN, & CICMT) | 2012
Robert Greenwell; B. M. McCue; M.I. Laurence; C.L. Fandrich; B.J. Blalock; Leon M. Tolbert; Syed K. Islam
The growing demand for hybrid electric vehicles (HEVs) has increased the need for high-temperature electronics that can operate at the temperatures that exist under the hood of these vehicles. In many cases this requires the use of thermal management systems to allow for the use of components not designed to operate at the ambient temperatures found in the engine compartment of an HEV. These systems add weight and complexity, which can increase the overall cost and reduce the efficiency of the vehicle. The alternative is to develop circuits and systems capable of operating with reduced or no thermal management. To this end, the latest version of our high-temperature gate driver integrated circuit (IC) has been developed. Designed and implemented on a 0.8-micron bipolar-CMOS-DMOS (BCD) on silicon-on-insulator (SOI) process, this gate driver chip is intended to drive silicon carbide (SiC) and other wide-bandgap (WBG) power field-effect transistors (FETs) for DC-DC converters and traction drives in HEVs. To ...
International Journal of High Speed Electronics and Systems | 2011
Liang Zuo; Robert Greenwell; Syed K. Islam; M. A. Huque; Benjamin J. Blalock; Leon M. Tolbert
In recent years, increasing demand for hybrid electric vehicles (HEVs) has generated the need for reliable and low-cost high-temperature electronics which can operate at the high temperatures under the hood of these vehicles. A high-voltage and high temperature gate-driver integrated circuit for SiC FET switches with short circuit protection has been designed and implemented in a 0.8-micron silicon-on-insulator (SOI) high-voltage process. The prototype chip has been successfully tested up to 200°C ambient temperature without any heat sink or cooling mechanism. This gate-driver chip can drive SiC power FETs of the DC-DC converters in a HEV, and future chip modifications will allow it to drive the SiC power FETs of the traction drive inverter. The converter modules along with the gate-driver chip will be placed very close to the engine where the temperature can reach up to 175ΰC. Successful operation of the chip at this temperature with or without minimal heat sink and without liquid cooling will help achieve greater power-to-volume as well as power-to-weight ratios for the power electronics module.
ieee aerospace conference | 2008
Yuan Chen; Mohammad Mojaradi; Nazeeh Aranki; Ehsan Kazemian; Robert Grogan; Elizabeth A. Kolawa; Benjamin J. Blalock; Robert Greenwell; Lynett Westergard
In this paper, we present a methodology for design and qualification of microelectronics for low temperature applications, which has enabled the successful infusion of a custom designed Operational Amplifier into flight mission. The Op-Amp was designed to target a wide temperature range of -150degC to +125degC for at least 5 years operation for Mars Mission. The design and qualification methodology developed have provided the critical path for the technology infusion.