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Dive into the research topics where Shoji Kubono is active.

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Featured researches published by Shoji Kubono.


international solid-state circuits conference | 1999

A 256 Mb multilevel flash memory with 2 MB/s program rate for mass storage applications

Atsushi Nozoe; Hiroaki Kotani; T. Tsujikawa; K. Yoshida; Kazunori Furusawa; Masataka Kato; T. Nishimoto; Hitoshi Kume; H. Kurata; N. Miyamoio; Shoji Kubono; I. Kanamitsu; K. Koda; Takeshi Nakayama; Y. Kouro; A. Hosogane; Natsuo Ajika; Kazuo Kobayashi

A 256 Mb flash memory in 0.26 /spl mu/m CMOS on a 138.6 mm/sup 2/ die uses a multilevel technique. The AND-type memory cell suitable for multilevel operation is used. One sector consists of(8192+256) memory cells. As two bits of data are stored in one physical cell, logical sector size is (16384+512)b. Sector erase and program times are both 1 ms/sector (2048+64B), so typical programming rate is 2 MB/s. By increasing sector size to four times that in conventional two-level flash memories, program throughput is kept acceptable for mass-storage applications, even with multi-level operation.


IEEE Journal of Solid-state Circuits | 1991

A 4-Mb pseudo SRAM operating at 2.6+or-1 V with 3- mu A data retention current

Katsuyuki Sato; Kanehide Kenmizaki; Shoji Kubono; Toshio Mochizuki; Hidetomo Aoyagi; Michitaro Kanamitsu; Soichi Kunito; Hiroyuki Uchida; Yoshihiko Yasu; Atsushi Ogishima; Sho Sano; Hiroshi Kawamoto

A 4-Mb pseudo static RAM (PSRAM) suitable for universal battery usage is described. The wide voltage range, 2.6+or-1 V, is set to target the power supply voltage of the PSRAM considering various voltage levels and charging-discharging characteristics of batteries. A double-to-single automatically switchable booster is developed to provide the wide voltage range operation. To reduce the power dissipation of data retention for battery usage a low-power back-bias generator with a new substrate-level sensor and a temperature-dependent self-refresh timer with a unique internal refresh control scheme are demonstrated. A PSRAM operation ranging from 1 V to more than 5 V was obtained and a 3- mu A data retention current was realized at room temperature in contrast with 7 mu A at 70 degrees C and V/sub cc/ of 2.6 V. This PSRAM allows a 20-Mbyte RAM disk to retain data for two months with a single lithium battery. >


international solid-state circuits conference | 2001

A 126.6 mm/sup 2/ AND-type 512 Mb flash memory with 1.8 V power supply

Tatsuya Ishii; Kazuyoshi Oshima; Hiroshi Sato; Satoshi Noda; Jiro Kishimoto; Hiroaki Kotani; Atsushi Nozoe; Kazunori Furusawa; Takayuki Yoshitake; Masataka Kato; Masahito Takahashi; Akihiko Sato; Shoji Kubono; Kiichi Manita; Kenji Koda; Takeshi Nakayama; Akira Hosogane

A 512 Mb AND-type flash memory in 0.18 /spl mu/m CMOS achieves 126.6 mm/sup 2/ die size, uses a multilevel technique, and adapts to 1.8 V operation. In addition, a read-modify-write mode enables programming free from pre-programmed states.


Archive | 1997

Semiconductor integrated circuit with multiple write operation modes

Takayuki Kawahara; Hiroshi Sato; Atsushi Nozoe; Keiichi Yoshida; Satoshi Noda; Shoji Kubono; Hiroaki Kotani; Katsutaka Kimura


Archive | 2001

Nonvolatile semiconductor memory and read method

Hiroshi Sato; Shoji Kubono; Toshinori Harada; Takayuki Kawahara; Naoki Miyamoto


Archive | 2002

Semiconductor device, data processing system and a method for changing threshold of a non-volatile memory cell

Michitaro Kanamitsu; Tetsuya Tsujikawa; Toshinori Harada; Hiroaki Kotani; Shoji Kubono; Atsushi Nozoe; Takayuki Yoshitake


Archive | 2004

Semiconductor, memory card, and data processing system

Tetsuya Tsujikawa; Atsushi Nozoe; Michitaro Kanamitsu; Shoji Kubono; Eiji Yamamoto; Ken Matsubara


Archive | 2001

Semiconductor integrated circuit and nonvolatile semiconductor memory

Jiro Kishimoto; Hiroshi Sato; Satoshi Noda; Tatsuya Ishii; Shoji Kubono; Takashi Ogino


Archive | 2012

Semiconductor memory system

Shoji Wada; Kanehide Kenmizaki; Masaya Muranaka; Masahiro Ogata; Hidetomo Aoyagi; Tetsuya Kitame; Masahiro Katayama; Shoji Kubono; Yukihide Suzuki; Makoto Morino; Sinichi Miyatake; Seiichi Shundo; Yoshihisa Koyama; Nobuhiko Ohno


Archive | 2001

Semiconductor integrated circuit and nonvolatile

Jiro Kishimoto; Hiroshi Sato; Satoshi Noda; Tatsuya Ishii; Shoji Kubono; Takashi Ogino

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