Steve Marum
Texas Instruments
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Publication
Featured researches published by Steve Marum.
electrical overstress electrostatic discharge symposium | 2007
Agha Jahanzeb; Yen-Yi Lin; Steve Marum; Joe Schichl; Charvaka Duvvury
Effect of device size on the peak CDM current is discussed. The current increases monotonically for small packages and then saturates for sizes larger than 1000 mm2. Size of the charge plate of the CDM tester contributed to this behavior. The current was not found to be constant across the package. Instead, it showed maximum value in the middle and minimum at the outer edge. An unexpected variation in CDM current is also reported for long pulse sequences.
electrical overstress/electrostatic discharge symposium | 2004
Charvaka Duvvury; Robert Steinhoff; Gianluca Boselli; Vijay Reddy; Hans Kunz; Steve Marum; Roger A. Cline
2009 31st EOS/ESD Symposium | 2009
Steve Marum; Charvaka Duvvury; Jae Park; Alan Chadwick; Agha Jahanzeb
electrical overstress/electrostatic discharge symposium | 2006
Hans Kunz; Charvaka Duvvury; Jonathan Brodsky; Partha Chakraborty; Agha Jahanzeb; Steve Marum; Larry Ting; Joe Schichl
2009 31st EOS/ESD Symposium | 2009
Agha Jahanzeb; Charvaka Duvvury; Joe Schichl; James McGee; Steve Marum; Scott Ward
electrical overstress/electrostatic discharge symposium | 2006
Dening Wang; Steve Marum; Wolfgang Kemper; David McLain
electrical overstress electrostatic discharge symposium | 2008
Agha Jahanzeb; Charvaka Duvvury; Joe Schichl; James McGee; Steve Marum; Peter L. Koeppen; Scott Ward; Yen-Yi Lin
electrical overstress electrostatic discharge symposium | 2012
Steve Marum; Wolfgang Kemper; Yen-Yi Lin; Paul Barker
Archive | 2011
Charvaka Duvvury; Steve Marum
electrical overstress electrostatic discharge symposium | 2008
Yen-Yi Lin; Jae Park; Ori Isachar; Shlomy Chaikin; Ram Chundru; Charvaka Duvvury; Steve Marum; Tom Diep
