Takaaki Kumazawa
Hitachi
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Publication
Featured researches published by Takaaki Kumazawa.
defect and fault tolerance in vlsi and nanotechnology systems | 2002
Yuichi Hamamura; Kazunori Nemoto; Takaaki Kumazawa; Hisafumi Iwata; Kousuke Okuyama; Shiro Kamohara; Aritoshi Sugimoto
We propose a general method for repair yield estimation based on critical area analysis using a commercial Monte-Carlo simulator. We classify failures into several types according to the repair rules and use iterative critical area analysis for each type of failure (ICAA-ETF) to calculate the repair yield. Our proposed method makes it possible to accurately estimate within a few hours the repair yield of a memory product. An example of application to an actual SRAM product is discussed to illustrate in detail how our method can be used for critical area calculation and repair yield modeling.
Archive | 2002
Yuichi Hamamura; Takaaki Kumazawa; Hisao Asakura; Aritoshi Sugimoto; Kazuyuki Tsunokuni
Archive | 2002
Yuichi Hamamura; Takaaki Kumazawa; Hisao Asakura; Kazuyuki Tsunokuni; Aritoshi Sugimoto
Archive | 2002
Yuichi Hamamura; Takaaki Kumazawa; Hisao Asakura; Aritoshi Sugimoto; Kazuyuki Tsunokuni
Archive | 2002
Yuichi Hamamura; Takaaki Kumazawa; Hisao Asakura; Kazuyuki Tsunokuni; Aritoshi Sugimoto
Archive | 2002
Yuichi Hamamura; Takaaki Kumazawa; Hisao Asakura; Aritoshi Sugimoto; Kazuyuki Tsunokuni
Archive | 2006
Noriyasu Ninagawa; Noriaki Yamamoto; Yasuhiro Hamatsuka; Takaaki Kumazawa; Masanori Ikuzawa
Archive | 2002
Yuichi Hamamura; Takaaki Kumazawa; Hisao Asakura; Aritoshi Sugimoto; Kazuyuki Tsunokuni
Archive | 2006
Takaaki Kumazawa
The proceedings of the JSME annual meeting | 2004
Noriyasu Ninagawa; Noriaki Yamamoto; Takaaki Kumazawa; Yoshiharu Sekiya; Yuzo Hiroshige
