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Featured researches published by Takeyuki Mizutani.


Optical Microlithography XVI | 2003

Nikon F2 exposure tool development

Soichi Owa; Yukako Matsumoto; Yasuhiro Ohmura; Shigeru Sakuma; Takashi Aoki; Jin Nishikawa; Hiroyuki Nagasaka; Takeyuki Mizutani; Naomasa Shiraishi; Kazuhiro Kido; Issei Tanaka; Jun Nagatsuka

Present status of development of F2 (157nm) exposure tool in Nikon is described. Key points of F2 exposure tool are reported; low aberration projection optics, CaF2 quality, coating durability and gas purging of the pellicle space. We also report the measurement of refractive index inhomogeneity inside CaF2 crystals, which is suspected as the cause of local flare. Characteristics of high NA optics over 0.9 are investigated by imaging simulations for both 193nm and 157nm wavelengths, which are compared NA=0.85 imaging.


Archive | 2007

Maintenance method, exposure method and apparatus, and device manufacturing method

Yuichi Shibazaki; Takeyuki Mizutani; Go Ichinose; Makoto Shibuta


Archive | 2005

Substrate for Exposure, Exposure Method and Device Manufacturing Method

Takeyuki Mizutani


Archive | 2006

Exposure apparatus, exposure method, and device production method

Tohru Kiuchi; Takeyuki Mizutani; Masahiro Nei; Masato Hamatani; Masahiko Okumura


Archive | 2006

Substrate holding device, exposure device, exposure method, and device fabrication method

Takeyuki Mizutani; Yuichi Shibazaki; Makoto Shibuta


Archive | 2014

Exposure apparatus, exposure method, and method for producing device

Takeyuki Mizutani


Archive | 2008

Substrate processing method, exposure apparatus, and method for producing device

Katsushi Nakano; Masahiko Okumura; Tarou Sugihara; Takeyuki Mizutani; Tomoharu Fujiwara


Archive | 2008

Liquid Removing Apparatus, Exposure Apparatus and Device Fabricating Method

Takeyuki Mizutani


Archive | 2005

Substrate processing method and device production system

Katsushi Nakano; Masahiko Okumura; Tarou Sugihara; Takeyuki Mizutani; Tomoharu Fujiwara


Archive | 2007

Substrate holding apparatus, exposure apparatus, and device production method

Takeyuki Mizutani; Yuichi Shibazaki

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