Toshiharu Nagumo
Renesas Electronics
Network
Latest external collaboration on country level. Dive into details by clicking on the dots.
Publication
Featured researches published by Toshiharu Nagumo.
international electron devices meeting | 2010
Toshiharu Nagumo; Kiyoshi Takeuchi; Takashi Hase; Y. Hayashi
Distributions of trap position, energy, amplitude, time constants of random telegraph noise and their correlation are examined by characterizing multiple individual traps. The traps detected were not uniformly distributed in the energy space. Contrary to the elastic tunneling model, there was no correlation between the time constants and depth-wise position.
international electron devices meeting | 2009
Toshiharu Nagumo; Kiyoshi Takeuchi; S. Yokogawa; K. Imai; Y. Hayashi
New analysis methods useful for understanding both complex waveforms and statistical behaviors of Random Telegraph Noise (RTN) are proposed. Complex waveforms are clearly visualized using Time Lag Plots. Bias dependence of statistically extracted average trap number is discussed, with emphasis on the importance of undetectable traps on product reliability.
Archive | 2011
Toshiharu Nagumo; Kiyoshi Takeuchi
symposium on vlsi circuits | 2011
Kiyoshi Takeuchi; Toshiharu Nagumo; Takashi Hase
Archive | 2014
Toshiharu Nagumo
Archive | 2013
Tomohiro Hirai; Toshiharu Nagumo
Archive | 2014
Toshiharu Nagumo
Archive | 2013
Tomohiro Hirai; Shogo Mochizuki; Toshiharu Nagumo
Archive | 2015
Toshiharu Nagumo; Kiyoshi Takeuchi; Toyoji Yamamoto
Archive | 2013
Tomohiro Hirai; 友洋 平井; Toshiharu Nagumo; 俊治 南雲