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Featured researches published by Vijay Wakharkar.


Archive | 2008

Flip Chip Packaging for Nanoscale Silicon Logic Devices: Challenges and Opportunities

Debendra Mallik; Ravi Mahajan; Vijay Wakharkar

After decades of following the roadmap laid out by Moore’s law [1], silicon features have reached the nanoscale, which is below 100 nm in dimension, as illustrated in Fig. 22.1. The first logic products with 90-nm transistors, using the traditional silicon dioxide insulator and polysilicon gate, went into volume production in 2003. More recently in 2007, 45-nm devices using a revolutionary high-k metal gate transistor technology have been introduced [2, 3]. These nanoscale devices enable higher performance circuits, which in turn drive advanced features in their packaging. These devices can significantly lower the power consumption of high-performance logic products creating new applications in the fast-growing ultramobile market (Fig. 22.2) and thus requiring packaging to support the demands of these form factors. This chapter will discuss the challenges and opportunities in flip chip packaging for these nanoscale devices.


ASME 2005 Pacific Rim Technical Conference and Exhibition on Integration and Packaging of MEMS, NEMS, and Electronic Systems collocated with the ASME 2005 Heat Transfer Summer Conference | 2005

Future Direction and Challenges for Microelectronics Packaging Materials

Vijay Wakharkar; Jr. James Chandler Matayabas

The continual increasing performance of microelectronics products places a high demand on packaging technologies. This presentation will discuss the current environment, challenges, and technologies being pursued. Package technology migrations for microprocessors and communication products are described. Material needs for high thermal dissipation, high-speed signaling, and high-density interconnects are discussed. Microprocessor scaling for increased performance and reduced cost places significant challenges on power delivery and power removal due to reducing dimensions, operating voltages, and increasing power. Meeting these challenges indicates a need for advanced packaging solutions using advanced materials. New methodologies, metrologies, and materials/process technologies to address these challenges are also highlighted.Copyright


Archive | 2003

Modular device assemblies

Terry Sterrett; Vijay Wakharkar


Mrs Bulletin | 2003

Critical aspects of high-performance microprocessor packaging

Vasudeva Atluri; Ravi Mahajan; Priyavadan R. Patel; Debendra Mallik; John Tang; Vijay Wakharkar; Gregory M. Chrysler; Chia-Pin Chiu; Gaurang N. Choksi; Ram S. Viswanath


Archive | 2005

Chip package thermal interface materials with dielectric obstructions for body-biasing, methods of using same, and systems containing same

Ashay A. Dani; Anna M. Prakash; Saikumar Jayaraman; Mitesh C. Patel; Vijay Wakharkar


Archive | 2003

No-flow underfill composition and method

Christopher L. Rumer; Tian-An Chen; Vijay Wakharkar; Paul A. Koning


Archive | 2011

Electronic packages with fine particle wetting and non-wetting zones

Nirupama Chakrapani; Vijay Wakharkar; Chris Matayabas


Archive | 2006

Applications of smart polymer composites to integrated circuit packaging

Nirupama Chakrapani; James Chris Matayabas; Vijay Wakharkar


Archive | 2005

Chip package dielectric sheet for body-biasing

Ashay A. Dani; Anna M. Prakash; Saikumar Jayaraman; Mitesh C. Patel; Vijay Wakharkar


Archive | 2008

MICROELECTRONIC PACKAGE WITH WEAR RESISTANT COATING

Nirupama Chakrapani; Vijay Wakharkar; Janet Feng; Nisha Ananthakrishnan; Shankar Ganapathysubranian; Gregory S. Constable

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