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Von Kamienski Elard Dr. Stein

Infineon Technologies

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Publication

Featured researches published by Von Kamienski Elard Dr. Stein.

Archive | 2002

Bitline contacts in a memory cell array

Grit Schwalbe; Kae-Horng Wang; Klaus Feldner; Von Kamienski Elard Dr. Stein

Archive | 1999

Non-volatile nor semiconductor memory device and method for the programming thereof

Von Kamienski Elard Dr. Stein; Peter Wawer; Christoph Ludwig; Christoph Kutter; Georg Georgakos; Andreas Liebelt; Jakob Kriz; Kai Huckels

Archive | 1984

Integrated logic circuit

Peter Baumgartner; Patrick Haibach; Robert Strenz; Christian Geissler; Von Kamienski Elard Dr. Stein

Archive | 2002

Native field effect transistor and method of manufacturing same

Ayad Abdul-Hak; Dirk Caspary; Achim Gratz; Patrick Haibach; Christoph Kutter; Von Kamienski Elard Dr. Stein

Archive | 2005

USB interface plug in electronic unit has moulded housing with electronic components including multiple layer connections through lead frame integrated in connector

Johannes Hankofer; Harry Hedler; Armin Kohlhase; Heiko Dipl.-Ing. Roeper; Von Kamienski Elard Dr. Stein

Archive | 2004

Verfahren zur Herstellung von Charge-trapping-Speicherbauelementen A process for the preparation of charge-trapping memory devices

Roland Haberkern; Roman Knoefler; Veronika Polei; Stephan Riedel; Von Kamienski Elard Dr. Stein; Georg Tempel

Archive | 2002

Contacts de ligne binaire dans une matrice de cellules memoire

Grit Schwalbe; Kae-Horng Wang; Klaus Feldner; Von Kamienski Elard Dr. Stein

Archive | 2002

Halbleiteranordnung und Verfahren zu ihrer Herstellung A semiconductor device and process for their preparation

Veronika Polei; Stephan Riedel; Von Kamienski Elard Dr. Stein; Mirko Dr. Vogt

Archive | 2002

Production of trenched bit lines in a semiconductor memory comprises using a mask which is produced whilst an auxiliary layer is applied on the whole surface and structured using a lacquer mask

Joachim Dr. Deppe; Roman Knöfler; Von Kamienski Elard Dr. Stein

Archive | 2002

Wafer testing and marking process for semiconductor components with fusing structures

Ayad Abdul-Hak; Dirk Caspary; Achim Gratz; Patrick Haibach; Christoph Kutter; Von Kamienski Elard Dr. Stein

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Collaboration

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Patrick Haibach

Infineon Technologies

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Stephan Riedel

Infineon Technologies

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Veronika Polei

Infineon Technologies

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Achim Gratz

Infineon Technologies

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Ayad Abdul-Hak

Infineon Technologies

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Christoph Kutter

Infineon Technologies

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Christoph Ludwig

Infineon Technologies

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Dirk Caspary

Infineon Technologies

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Joachim Dr. Deppe

Infineon Technologies

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Grit Schwalbe

Infineon Technologies

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