Zain K. Saidin

Results from a new die-to-database reticle inspection platform

A new DUV die-to-database high-resolution reticle defect inspection platform has been developed. This platform is designed to meet the 90nm through 65nm node 248/193nm lithography reticle qualification requirements of the IC industry. These design nodes typically include: COG layers, EPSM layers, and AltPSM layers, plus aggressive OPC which includes jogs, serifs, and SRAF (sub-resolution assist features). The architecture and technology of the new inspection platform is described. Die-to-database inspection results are shown on standard programmed defect test reticles, as well as, advanced 90nm through 65nm node reticles from industry sources. Results show high sensitivity and low false detections being achieved.

Results from a new reticle defect inspection platform

A new DUV high-resolution reticle defect inspection platform has been developed to meet the sub-90nm node 248/193nm lithography reticle qualification requirements of the IC industry. This advanced lithography process typically includes COG layers, EPSM layers, and AltPSM layers; aggressive OPC is typically used which includes jogs, serifs, and SRAF (sub-resolution assist features). The architecture and performance of the new reticle defect inspection platform is described. Die-to-die inspection results on standard programmed defect test reticles are presented showing typically 50nm edge placement defect sensitivity, 80nm point defect sensitivity, 5.5% flux defect sensitivity, and 100nm quartz phase defect sensitivity. Low false detection results are also shown on 90nm node and below product reticles. Direct comparisons with UV wavelength inspections show measurable sensitivity improvement and a reduction in false detections. New lithography oriented defect detectors are discussed and data shown.