Bradley A. Orner
IBM
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Featured researches published by Bradley A. Orner.
bipolar/bicmos circuits and technology meeting | 2001
Alvin J. Joseph; D. Coolbaugh; Michael J. Zierak; R. Wuthrich; Peter J. Geiss; Zhong-Xiang He; Xuefeng Liu; Bradley A. Orner; Jeffrey B. Johnson; G. Freeman; David C. Ahlgren; Basanth Jagannathan; Louis D. Lanzerotti; John C. Malinowski; Huajie Chen; J. Chu; Peter B. Gray; Robb Allen Johnson; James S. Dunn; Seshadri Subbanna; Kathryn T. Schonenberg; David L. Harame; R. Groves; K. Watson; D. Jadus; M. Meghelli; A. Rylyakov
A BiCMOS technology is presented that integrates a high performance NPN (f/sub T/=120 GHz and f/sub max/=100 GHz), ASIC compatible 0.11 /spl mu/m L/sub eff/ CMOS, and a full suite of passive elements. Significant HBT performance enhancement compared to previously published results has been achieved through further collector and base profile optimization guided by process and device simulations. Base transit time reduction was achieved by simultaneously increasing the Ge ramp and by limiting the base diffusion with the addition of carbon doping to SiGe epitaxial base. This paper describes IBMs next generation SiGe BiCMOS production technology targeted at the communications market.
Ibm Journal of Research and Development | 2003
James S. Dunn; David C. Ahlgren; Douglas D. Coolbaugh; Natalie B. Feilchenfeld; G. Freeman; David R. Greenberg; Robert A. Groves; Fernando Guarin; Youssef Hammad; Alvin J. Joseph; Louis D. Lanzerotti; Stephen A. St. Onge; Bradley A. Orner; Jae Sung Rieh; Kenneth J. Stein; Steven H. Voldman; Ping-Chuan Wang; Michael J. Zierak; Seshadri Subbanna; David L. Harame; Dean A. Herman; Bernard S. Meyerson
This paper provides a detailed description of the IBM SiGe BiCMOS and rf CMOS technologies. The technologies provide high-performance SiGe heterojunction bipolar transistors (HBTs) combined with advanced CMOS technology and a variety of passive devices critical for realizing an integrated mixed-signal system-on-a-chip (SoC). The paper reviews the process development and integration methodology, presents the device characteristics, and shows how the development and device selection were geared toward usage in mixed-signal IC development.
bipolar/bicmos circuits and technology meeting | 2007
Scott K. Reynolds; Alberto Valdes-Garcia; Brian A. Floyd; Troy J. Beukema; Brian P. Gaucher; Duixian Liu; Nils Deneke Hoivik; Bradley A. Orner
A feature-rich second-generation 60-GHz transceiver chipset is introduced. It integrates dual-conversion superheterodyne receiver and transmitter chains, a sub-integer frequency synthesizer, full programmability from a digital interface, modulator and demodulator circuits to support analog modulations (e.g. MSK, BPSK), as well as a universal I&Q interface for digital modulation formats (e.g. OFDM). Achieved performance includes 6-dB receiver noise figure and 12 dBm transmitter output ldB compression point. Wireless link experiments with different modulation formats for 2-Gb/s real-time uncompressed HDTV transmission are discussed. Additionally, recent millimeter-wave package and antenna developments are summarized and a 60GHz silicon micromachined antenna is presented.
bipolar/bicmos circuits and technology meeting | 2006
Bradley A. Orner; Mattias E. Dahlstrom; A. Pothiawala; Robert M. Rassel; Qizhi Liu; Hanyi Ding; Marwan H. Khater; David C. Ahlgren; Alvin J. Joseph; James S. Dunn
The paper presents a 0.13 mum SiGe BiCMOS technology for millimeter wave applications. This technology features a high performance HBT (fT = 300 GHz /fmax = 330 GHz) along with various newly developed millimeter wave features, such varactor, Schottky and p-i-n diodes and other back end of line passives
bipolar/bicmos circuits and technology meeting | 1999
S. St Onge; David L. Harame; James S. Dunn; Seshadri Subbanna; David C. Ahlgren; G. Freeman; Basanth Jagannathan; J. Jeng; Kathryn T. Schonenberg; Kenneth J. Stein; R. Groves; D. Coolbaugh; Natalie B. Feilchenfeld; Peter J. Geiss; M. Gordon; Peter B. Gray; Douglas B. Hershberger; S. Kilpatrick; Robb Allen Johnson; Alvin J. Joseph; Louis D. Lanzerotti; John C. Malinowski; Bradley A. Orner; Michael J. Zierak
A new base-after-gate integration scheme has been developed to integrate a 47 GHz f/sub t/, 65 GHz F/sub max/SiGe HBT process with a 0.24 /spl mu/m CMOS technology having 0.18 /spl mu/m L/sub eff/ and 5 nm gate oxide. We discuss the benefits and challenges of this integration scheme which decouples the HBT from the CMOS thermal cycles. We also describe the resulting 0.24 /spl mu/m SiGe BiCMOS technology, BiCMOS 6HP, which includes a 7 nm dual gate oxide option and full suite of passive components. The technology provides a high level of integration for mixed-signal RF applications.
bipolar/bicmos circuits and technology meeting | 2006
Robert M. Rassel; Jeffrey B. Johnson; Bradley A. Orner; Scott K. Reynolds; Mattias E. Dahlstrom; Jay Rascoe; Alvin J. Joseph; Brian P. Gaucher; James S. Dunn; S. St Onge
For the first time, a high performance, low leakage Schottky barrier diode (SBD) with cutoff frequency above 1.0 THz in a 130nm SiGe BiCMOS technology for millimeter-wave application is described. Device optimization has been evaluated by varying critical process and layout parameters such as, anode size, cathode depth, cathode resistivity, junction tailoring, and guardring optimization is investigated
international sige technology and device meeting | 2007
Brian P. Gaucher; Brian A. Floyd; Scott K. Reynolds; Ullrich R. Pfeiffer; Janusz Grzyb; Alvin J. Joseph; E Mina; Bradley A. Orner; H Ding; R Wachnik; K Walter
This paper establishes the viability and suitability of silicon germanium (SiGe8HP) technology, enablement tools and circuits to millimetre-wave applications today and a roadmap to the future. Key elements discussed include SiGe technology and design enablement advancements leading to the worlds most highly integrated, lowest power 60 GHz transmitter/receiver ICs.
bipolar/bicmos circuits and technology meeting | 2002
Natalie B. Feilchenfeld; Louis D. Lanzerotti; David C. Sheridan; Ryan W. Wuthrich; Peter J. Geiss; D. Coolbaugh; Peter B. Gray; J. He; P. Demag; J. Greco; T. Larsen; V. Patel; Michael J. Zierak; Wade J. Hodge; Jay Rascoe; J. Trappasso; Bradley A. Orner; A. Norris; Douglas B. Hershberger; B. Voegeli; Steven H. Voldman; Robert M. Rassel; V. Ramachandrian; Michael L. Gautsch; Ebenezer E. Eshun; R. Hussain; D. Jordan; S. St Onge; James S. Dunn
High frequency performance at low current density and low wafer cost is essential for low power wireless BiCMOS technologies. We have developed a low-complexity, ASIC-compatible, 0.18 /spl mu/m SiGe BiCMOS technology for wireless applications that offers 3 different breakdown voltage NPNs; with the high performance device achieving F/sub t//F/sub max/ of 60/85 GHz with a 3.0 V BV/sub CEO/. In addition, a full suite of high performance passive devices complement the state-of-the-art SiGe wireless HBTs.
custom integrated circuits conference | 2006
James S. Dunn; David L. Harame; Alvin J. Joseph; Stephen A. St. Onge; Natalie B. Feilchenfeld; Louis D. Lanzerotti; Bradley A. Orner; Ephrem G. Gebreselasie; Jeffrey B. Johnson; Douglas D. Coolbaugh; Robert M. Rassel; Marwan H. Khater
High performance communications applications have made technology choices more important than ever. Silicon germanium (SiGe) BiCMOS has enabled the widespread introduction of many these applications by providing superior cost and integration capability, compared to III-V solutions and, relative to RFCMOS, one can attain better time to market. BiCMOS integration approaches for high performance and cost performance NPN modules and state of the art passive elements are discussed as well as future technology directions
european microwave integrated circuit conference | 2007
Kwanhim Lam; Hanyi Ding; Xuefeng Liu; Bradley A. Orner; Jay Rascoe; Barbara Dewitt; Essam Mina; Brian P. Gaucher
Feasibility of wideband on-chip RF switch operating at millimeter wave frequencies using PIN diodes in IBM .13 mum SiGe technology is demonstrated. A SPDT reflective switch targeting 60 GHz wireless and radar applications is designed, fabricated, and measured. Good correlations between simulation and hardware are reported. Measured data show 2.0 to 2.7 dB of insertion loss over 51 to 78 GHz bandwidth with better than 12 dB return loss and 25 to 35 dB of isolation.