Is this you? Create Your Porfile
Avatar

Daniel Kavaldjiev

KLA-Tencor

Network

Latest external collaboration on country level. Dive into details by clicking on the dots.

Explore More

Hotspot

Dive into the research topics where Daniel Kavaldjiev is active.

Explore More

Publication

Featured researches published by Daniel Kavaldjiev.

Archive | 2007

Methods and systems for detecting pinholes in a film formed on a wafer or for monitoring a thermal process tool

David Chen; Andrew Steinbach; Daniel Kavaldjiev; Alexander Belyaev; Juergen Reich

Archive | 2005

Reduced coherence symmetric grazing incidence differential interferometer

Dieter Mueller; Rainer Schierle; Daniel Kavaldjiev

Journal of the Acoustical Society of America | 2010

Method and apparatus for scanning, stitching, and damping measurements of a double-sided metrology inspection tool

Paul J Sullivan; George Kren; Rodney Smedt; Hans Hansen; David W. Shortt; Daniel Kavaldjiev; Christopher F. Bevis

Archive | 2008

SYSTEMS AND METHODS FOR DETERMINING TWO OR MORE CHARACTERISTICS OF A WAFER

Stephen Biellak; Daniel Kavaldjiev

Archive | 2010

Photomultiplier tube optimized for surface inspection in the ultraviolet

Stephen Biellak; Daniel Kavaldjiev; Stuart Friedman

Archive | 2009

Method and apparatus for measuring shape or thickness information of a substrate

Shouhong Tang; George Kren; Dieter Mueller; Brian L. Haas; Daniel Kavaldjiev

Archive | 2008

Computer-implemented methods for inspecting and/or classifying a wafer

Juergen Reich; Louis Vintro; Prasanna Dighe; Andrew Steinbach; Daniel Kavaldjiev; Stephen Biellak

Archive | 2006

Computer-implemented methods and systems for determining a configuration for a light scattering inspection system

Alexander Belyaev; Daniel Kavaldjiev; Amith Murali; Aleksey Petrenko; Mike Kirk; David W. Shortt; Brian L. Haas; Kurt L. Haller

Archive | 2009

Computer-implemented methods, computer-readable media, and systems for determining one or more characteristics of a wafer

Haiguang Chen; Daniel Kavaldjiev; Louis Vintro; George Kren

Archive | 2013

Sample Inspection System Detector

Daniel Kavaldjiev; Stephen Biellak; Guoheng Zhao; Mehdi Vaez-Iravani

Explore More

Collaboration

Dive into the Daniel Kavaldjiev's collaboration.

Top Co-Authors
Avatar

Stephen Biellak

KLA-Tencor

View shared research outputs
Top Co-Authors
Avatar

George Kren

KLA-Tencor

View shared research outputs
Top Co-Authors
Avatar

Anatoly Romanovsky

KLA-Tencor

View shared research outputs
Top Co-Authors
Avatar

Christian Wolters

KLA-Tencor

View shared research outputs
Top Co-Authors
Avatar

Bret Whiteside

KLA-Tencor

View shared research outputs
Top Co-Authors
Avatar

David W. Shortt

KLA-Tencor

View shared research outputs
Top Co-Authors
Avatar

Guoheng Zhao

KLA-Tencor

View shared research outputs
Top Co-Authors
Avatar

Donald W. Pettibone

KLA-Tencor

View shared research outputs
Top Co-Authors
Avatar

Aleksey Petrenko

KLA-Tencor

View shared research outputs
Top Co-Authors
Avatar

Alexander Belyaev

KLA-Tencor

View shared research outputs
Explore More
Researchain Logo
Decentralizing Knowledge