Network


Latest external collaboration on country level. Dive into details by clicking on the dots.

Hotspot


Dive into the research topics where Stephen Biellak is active.

Publication


Featured researches published by Stephen Biellak.


Archive | 2002

Systems and methods for simultaneous or sequential multi-perspective specimen defect inspection

Mehdi Vaez-Iravani; Stan Stokowski; Stephen Biellak; Jamie Sullivan; Keith B. Wells; Mehrdad Nikoonahad


Archive | 2005

Methods and systems for inspection of a wafer

David W. Shortt; Stephen Biellak; Alexander Belyaev


Archive | 2008

SYSTEMS AND METHODS FOR DETERMINING TWO OR MORE CHARACTERISTICS OF A WAFER

Stephen Biellak; Daniel Kavaldjiev


Archive | 2006

Enhanced simultaneous multi-spot inspection and imaging

Stephen Biellak; David W. Shortt


Archive | 2010

Photomultiplier tube optimized for surface inspection in the ultraviolet

Stephen Biellak; Daniel Kavaldjiev; Stuart Friedman


Archive | 2008

Computer-implemented methods for inspecting and/or classifying a wafer

Juergen Reich; Louis Vintro; Prasanna Dighe; Andrew Steinbach; Daniel Kavaldjiev; Stephen Biellak


Archive | 2006

Systems and methods for determining a characteristic of a specimen

Stephen Biellak; David W. Shortt


Archive | 2008

Systems and methods for inspecting wafers

Mehdi Vaez-Iravani; Stephen Biellak


Archive | 2013

Sample Inspection System Detector

Daniel Kavaldjiev; Stephen Biellak; Guoheng Zhao; Mehdi Vaez-Iravani


Archive | 2012

Segmented polarizer for optimizing performance of a surface inspection system

Stephen Biellak; Daniel Kavaldjiev

Collaboration


Dive into the Stephen Biellak's collaboration.

Researchain Logo
Decentralizing Knowledge