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Dive into the research topics where George Kren is active.

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Featured researches published by George Kren.


Journal of the Acoustical Society of America | 1982

Acoustic method and apparatus for measuring micron and submicron distances

George Kren; Franklin R. Koenig

A gauge for measuring variations in distance of a surface relative to a reference by means of phase shifts in a zone of high acoustic impedance. A gauge head is provided with a first orifice for emitting acoustic waves, driven by a reference signal, toward a surface positioned very close to the gauge head, forming a high impedance zone. A second orifice in the gauge head picks up acoustic waves subjected to the zone and these waves are converted to electrical signals for comparison to the reference signal in a phase detector. The phase error between the two signals is indicative of surface distance variations.


Archive | 2006

Process and assembly for non-destructive surface inspections

Norbert Marxer; Kenneth P. Gross; Hubert Altendorfer; George Kren


Archive | 1993

Surface scanner with thin film gauge

Kenneth P. Gross; George Kren; Christopher F. Bevis


Archive | 2002

Process for identifying defects in a substrate having non-uniform surface properties

George Kren; Mehdi Vaez-Iravani; David W. Shortt


Archive | 2007

Wafer inspection systems and methods for analyzing inspection data

Paul J Sullivan; George Kren; Eliezer Rosengaus; Patrick Huet; Robinson Piramuthu; Martin Plihal; Yan Xiong


Archive | 1996

Improved system for surface inspection

Kenneth P. Gross; Hubert Altendorfer; George Kren


Archive | 2003

Darkfield inspection system having a programmable light selection array

Christopher F. Bevis; Paul J Sullivan; David W. Shortt; George Kren


Journal of the Acoustical Society of America | 2010

Method and apparatus for scanning, stitching, and damping measurements of a double-sided metrology inspection tool

Paul J Sullivan; George Kren; Rodney Smedt; Hans Hansen; David W. Shortt; Daniel Kavaldjiev; Christopher F. Bevis


Archive | 2009

Method and apparatus for measuring shape or thickness information of a substrate

Shouhong Tang; George Kren; Dieter Mueller; Brian L. Haas; Daniel Kavaldjiev


Archive | 2004

Copper CMP flatness monitor using grazing incidence interferometry

Dieter Mueller; George Kren; Cedric Affentauschegg

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