Eskinder Hailu

A new test and characterization scheme for 10+ GHz low jitter wide band PLL

This paper presents a new test and characterization scheme for 10+ GHz low jitter wide band PLL in 90 nm partially depleted (PD) silicon-on-insulator (SOI) CMOS technology. We measure the frequency range of VCOs without adding any devices for test between charge-pump (CP) and voltage-controlled oscillator (VCO). That test scheme gives us the intermediate frequency of VCO as well as the maximum and the minimum frequency. This paper also describes circuitry to observe the duty cycle of 4.2GHz clock directly on a wafer probe station, including a method to verify the measured duty cycle