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Dive into the research topics where Kenneth P. Gross is active.

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Featured researches published by Kenneth P. Gross.


Optical Science, Engineering and Instrumentation '97 | 1997

Interferometric testing of cylinder optics using a computer-generated hologram (CGH)

Patrick W. Tam; Kenneth P. Gross; James R. Bogan

In this paper we describe an interferometric technique for testing uniformity in surface figure of large cylinder optics. In our laser scanning system, we employ large (1 1 inch) cylinder mirrors for focusing of laser beams over a wide scan range. Performance of the system depends critically on the uniformity of the beam size on the focal plane over this scan range. Departure of portions of the surface figure from the ideal cylindrical surface lead to varying beam size that limit the performance of our systems. Initially we tested these mirrors with a metrology technique that sample beam size on the focal plane at various scan positions. This technique is both time consuming and unreliable. To circumvent these limitations, we developed a fast interferometric technique to qualify these mirrors using a computer generated hologram (CGH) as our reference cylinder optics. The methodology employed simulates the scanning process by subdividing the interferogram of the cylinder mirror into small sections that are of the order of the beam size, analyzing the surface figure over these subsections and then computing a figure of merit (FOM) that is tied to the uniformity of the surface figure over the entire mirror. The correlation between the two independent measurements is found to be very good. In the following we discuss briefly the methodology developed in the Zygo platform, which can be easily implemented as an automated QA procedure.


Archive | 2006

Process and assembly for non-destructive surface inspections

Norbert Marxer; Kenneth P. Gross; Hubert Altendorfer; George Kren


Archive | 1993

Surface scanner with thin film gauge

Kenneth P. Gross; George Kren; Christopher F. Bevis


Archive | 2004

Apparatus and method for detecting overlay errors using scatterometry

Walter D. Mieher; Ady Levy; Boris Golovanesky; Michael Friedmann; Ian Smith; Michael E. Adel; Anatoly Fabrikant; Christopher F. Bevis; Noah Bareket; Kenneth P. Gross; Piotr Zalicki; Dan Wack; Paola Dececco; Thaddeus Gerard Dziura; Mark Ghinovker


Archive | 2006

Systems and methods for measuring one or more characteristics of patterned features on a specimen

Dan Wack; Haiming Wang; Kenneth P. Gross


Archive | 1996

Improved system for surface inspection

Kenneth P. Gross; Hubert Altendorfer; George Kren


Archive | 2006

Measuring overlay and profile asymmetry using symmetric and anti-symmetric scatterometry signals

Daniel Kandel; Kenneth P. Gross; Michael Friedmann; Jiyou Fu; Shankar Krishnan; Boris Golovanevsky


Archive | 2014

Method and System for Controlling Convective Flow in a Light-Sustained Plasma

Ilya Bezel; Anatoly Shchemelinin; Matthew Derstine; Kenneth P. Gross; David W. Shortt; Wei Zhao; Anant Chimmalgi; Jincheng Wang


Archive | 2011

Cell For Light Source

Kenneth P. Gross; Yung-ho Chuang


Archive | 2014

System and Method for Imaging a Sample with a Laser Sustained Plasma Illumination Output

David W. Shortt; Steven R. Lange; Matthew Derstine; Kenneth P. Gross; Wei Zhao; Ilya Bezel; Anatoly Shchemelinin

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