James P. Libous
IBM
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Featured researches published by James P. Libous.
IEEE Transactions on Advanced Packaging | 2004
Madhavan Swaminathan; Joungho Kim; Istvan Novak; James P. Libous
The power consumption of microprocessors is increasing at an alarming rate leading to 2X reduction in the power distribution impedance for every product generation. In the last decade, high I/O ball grid array (BGA) packages have replaced quad flat pack (QFP) packages for lowering the inductance. Similarly, multilayered printed circuit boards loaded with decoupling capacitors are being used to meet the target impedance. With the trend toward system-on-package (SOP) architectures, the power distribution needs can only increase, further reducing the target impedance and increasing the isolation characteristics required. This paper provides an overview on the design of power distribution networks for digital and mixed-signal systems with emphasis on design tools, decoupling, measurements, and emerging technologies.
IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part B | 1997
James P. Libous; Daniel P. OConnor
This paper presents the simultaneous switching noise (SSN) measurements, modeling, and simulation of a flip-chip complementary metal-oxide-semiconductor (CMOS) application-specific integrated circuit (ASIC) test chip on a multilayer ceramic ball grid array (CBGA) package. Technology and design features of the chip and package test vehicles are described. Time-domain noise measurement techniques and results are presented in detail. Circuit modeling and simulation methodologies are developed and validated by strong correlation between measurement and simulation results.
IEEE Transactions on Advanced Packaging | 2006
Bhyrav Mutnury; Madhavan Swaminathan; James P. Libous
In this paper, a modeling technique using spline functions with finite time difference approximation is discussed for modeling moderately nonlinear digital input/output (I/O) drivers. This method takes into account both the static and the dynamic memory characteristics of the driver during modeling. Spline function with finite time difference approximation includes the previous time instances of the driver output voltage/current to capture the output dynamic characteristics of digital drivers accurately. In this paper, the speed and the accuracy of the proposed method is analyzed and compared with the radial basis function (RBF) modeling technique, for modeling different test cases. For power supply noise analysis, the proposed method has been extended to multiple ports by taking the previous time instances of the power supply voltage/current into account. The method discussed can be used to capture sensitive effects like simultaneous switching noise (SSN) and cross talk accurately when multiple drivers are switching simultaneously. A comparison study between the presented method and the transistor level driver models indicate a computational speed-up in the range of 10-40 with an error of less than 5%. For highly nonlinear drivers, a method based on recurrent artificial neural networks (RNN) is discussed.
IEEE Transactions on Advanced Packaging | 2002
Nanju Na; Jinwoo Choi; Madhavan Swaminathan; James P. Libous; Daniel P. O'Connor
This paper presents simulation and analysis of core switching noise for a CMOS ASIC test vehicle. The test vehicle consists of a ceramic ball grid array (CBGA) package on a printed circuit board (PCB). The entire test vehicle has been modeled by accounting for all the plane resonances using the cavity resonator method. The models included both the on-chip and off-chip decoupling capacitors. Using both time domain and frequency domain simulations, the role of plane resonances on power supply noise for fast current edge rates has been discussed. The models have been constructed to amplify certain parts of the test vehicle during simulations.
electrical performance of electronic packaging | 2003
Bhyrav Mutnury; Madhavan Swaminathan; James P. Libous
In this paper a modeling methodology using spline functions with finite time difference is proposed for modeling digital I/O drivers. Digital driver circuits can be accurately modeled using their static characteristics for normal excitations, but for faster excitations static characteristic models tend to lose their accuracy as the dynamic characteristics start to dominate the static characteristics. Spline function with finite time difference modeling includes previous time instances to capture dynamic characteristics for accurate modeling of digital drivers. In this paper the speed and accuracy of the proposed method is analyzed and compared with Radial Basis Function (RBF) modeling for different test cases.
international symposium on quality electronic design | 2001
Gulsun Yasar; Charles S. Chiu; Robert A. Proctor; James P. Libous
Optimized I/O cell placement techniques take into account electromigration (EM), IR drop, and dI/dt noise issues in the power distribution network. This paper describes fast and easy electrical checking algorithms to be used early in the design process to verify if the I/O placements meet placement guidelines, and explains the details of the I/O cell placement-related roles used by the checking tool. Use of these techniques and methods can ensure high quality ASICs.
electrical performance of electronic packaging | 1998
James P. Libous
This paper presents the characterization of flip-chip CMOS ASIC core logic and I/O simultaneous switching noise on several types of high density multilayer organic and ceramic ball grid array (BGA) and column grid array (CGA) packages. The results of time domain simultaneous switching output noise measurements with a CMOS test chip are presented. Core logic switching noise modeling and simulation results are also discussed.
electrical performance of electronic packaging | 1996
James P. Libous; D. P. O'Connor
This paper presents the simultaneous switching noise (SSN) measurements, modeling, and simulation of a flip-chip complementary metal-oxide-semiconductor (CMOS) application- A specific integrated circuit (ASIC) test chip on a multilayer ceramic ball grid array (CBGA) package. Technology and design features of the chip and package test vehicles are described. Time-domain noise measurement techniques and results are presented in detail. Circuit modeling and simulation methodologies are developed and validated by strong correlation between measurement and simulation results.
electronic components and technology conference | 2001
Nanju Na; Madhavan Swaminathan; James P. Libous; Daniel P. O'Connor
This paper presents simulation and analysis of core switching noise on a CMOS test vehicle. The test vehicle consists of a ceramic ball grid array (CBGA) package on a printed circuit board (PCB). The entire test vehicle has been modeled by accounting for all the plane resonances using the cavity resonator method. The models included both the on-chip and off-chip decoupling capacitors. Using both time domain and frequency domain simulations, the role of plane resonances on power supply noise for fast current edge rates has been discussed. The models have been constructed to amplify certain parts of the test vehicle during simulations.
Archive | 1999
Robert A. Gottschall; Roger P. Gregor; James P. Libous