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Featured researches published by James R. Schwank.


Archive | 2010

Dosimetry Experiments at the MEDUSA Facility (Little Mountain)

Victor Jozef Harper-Slaboszewicz; M.R. Shaneyfelt; Timothy J. Sheridan; E. Frederick Hartman; James R. Schwank

A series of experiments on the MEDUSA linear accelerator radiation test facility were performed to evaluate the difference in dose measured using different methods. Significant differences in dosimeter-measured radiation dose were observed for the different dosimeter types for the same radiation environments, and the results are compared and discussed in this report.


2000 IEEE Nuclear and Space Radiation Effects Conference, Reno, NV (US), 07/24/2000--07/28/2000 | 2000

Single-event upset and snapback in silicon-on-insulator devices

Paul E. Dodd; M.R. Shaneyfelt; James R. Schwank; G.L. Hash; Bruce L. Draper; P.S. Winokur


2000 IEEE Nuclear and Space Radiation Effects Conference, Reno, NV (US), 07/24/2000--07/28/2000 | 2000

Thermal-stress effects on enhanced low-dose-rate sensitivity of linear bipolar circuits

M.R. Shaneyfelt; James R. Schwank; Steven C. Witczak; L.C. Riewe; P.S. Winokur; G.L. Hash


Archive | 2003

Developing passivation layers for reducing enhanced low-dose-rate sensitivity in linear bipolar devices.

Paul E. Dodd; L.C. Riewe; Ronald L. Pease; M.R. Shaneyfelt; Sunny Gupta; James R. Schwank; Michael C. Maher


215th ECS Meeting | 2009

Moisture Effects on the 1/F Noise Of Mos Devices

Daniel M. Fleetwood; Sarah A. Francis; Aritra Dasgupta; Xing Zhou; Ronald D. Schrimpf; M.R. Shaneyfelt; James R. Schwank


Archive | 2006

Effects of angle of incidence on proton-induced single-event latchup.

James R. Schwank; M.R. Shaneyfelt; J. Baggio; J. A. Felix; V. Ferlet-Cavrois; P. Paillet; Gary K. Lum; Paul E. Dodd; Sandra-Lynn Girard; Ewart W. Blackmore


Archive | 2005

Effects of particle energy on proton and neutron-induced single-event latchup.

V. Ferlet-Cavrois; James R. Schwank; J. A. Felix; P. Paillet; M.R. Shaneyfelt; G.L. Hash; Frederick William Sexton; Ewart W. Blackmore; Paul E. Dodd; J. Baggio


Archive | 2008

Direct Evidence of Secondary Events Induced by High Energy Protons.

James R. Schwank; M.R. Shaneyfelt; Giorgio Cellere; Alessandro Paccagnella; Angelo Visconti; Silvia Beltrami; P. Paillet; V. Ferlet-Cavrois; J. Baggio; Ewart W. Blackmore


IEEE Transactions on Nuclear Science, Dec. 2007 | 2007

Power MOSFET Degradation in Space Radiation Environments.

J. A. Felix; M.R. Shaneyfelt; James R. Schwank; Paul E. Dodd; Joseph Brandon Witcher; Scott M. Dalton


5th European Conference, RADECS99, Abbaye be Fontevraud (FR), 08/13/1999--08/17/1999 | 1999

New Insights into Fully-Depleted SOI Transistor Response During Total-Dose Irradiation

Paul E. Dodd; James R. Schwank; M.R. Shaneyfelt

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M.R. Shaneyfelt

Sandia National Laboratories

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Paul E. Dodd

Sandia National Laboratories

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J. A. Felix

Sandia National Laboratories

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Bruce L. Draper

Sandia National Laboratories

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Melanie D. Berg

Goddard Space Flight Center

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Paul W. Marshall

Goddard Space Flight Center

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Scott M. Dalton

Sandia National Laboratories

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