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Dive into the research topics where Jonathan P. Lotz is active.

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Featured researches published by Jonathan P. Lotz.


international solid-state circuits conference | 1996

A quad-issue out-of-order RISC CPU

Jonathan P. Lotz; Samuel D. Naffziger; Donald Kipp

A 64 b 4-way superscalar PA-RISC microprocessor system operating from 150-250 MHz combines full out-of-order execution with low-cycle time, to produce >360 specint and >550 specfp. Specialized latching and clock circuits and extensive use of dynamic logic enable high frequency operation. 3.8 M logic transistors are integrated on a 17.68/spl times/19.1 mm/sup 2/ die in 3.3 V 0.5 /spl mu/m CMOS.


IEEE Journal of Solid-state Circuits | 1990

A CMOS RISC CPU designed for sustained high performance on large applications

Jonathan P. Lotz; B. Miller; Eric Delano; Joel D. Lamb; Mark Forsyth; Thomas R. Hotchkiss

A 90-MHz CMOS CPU has been designed for sustained performance in workstation and commercial/technical multiuser applications. The CPU is part of a multichip system that achieves a 60-MHz operating frequency with 15-ns asynchronous SRAMs. Key performance features include a 3.5-ns 32-b adder, low skew on-chip clock buffers, and cycling large off-chip caches at the operating frequency. The chip has been fabricated using a 1.0- mu m CMOS process that utilizes three-level metal and 480000 transistors on a 14*14-mm die. >


international solid-state circuits conference | 1990

A 90 MHz CMOS RISC CPU designed for sustained performance

Darius Tanksalvala; Joel D. Lamb; Michael A. Buckley; B. Long; S. Chapin; Jonathan P. Lotz; Eric Delano; Richard John Luebs; K. Erskine; S. McMullen; Mark Forsyth; R. Novak; T. Gaddis; Doug Quarnstrom; Craig A. Gleason; E. Rashid; Daniel Lee Halperin; L. Sigel; H. Hill; Craig Simpson; D. Hollenbeck; J. Spencer; Robert J. Horning; H. Tran; Thomas R. Hotchkiss; Duncan Weir; Donald Kipp; J. Wheeler; Patrick Knebel; J. Yetter

A CMOS CPU which operates at 90 MHz under typical conditions and implements an existing RISC (reduced-instruction-set-computer) 140-instruction set is described. The processor has been designed for sustained performance for workstation and both commercial and technical multiuser applications. Key performance features include a 3-ns, 32-b adder; low-skew on-chip clock buffers; and cycling off-chip caches at the operating frequency, using industry-standard synchronous static random-access memories (SRAMs). The speeds obtained are comparable to those of many emitter-coupled logic (ECL) implementations. The CPU chip includes the following hardware: integer fetch and execute unit, on-chip split I/D TLBs (translation lookaside buffers) with two-way 64 entries each, control for second-level off-chip TLBs, control for off-chip two-way split I/D writeback caches with single-bit error correction for data, full multiprocessing support hardware, inference for performance analysis and tuning, and a tightly coupled coprocessor interface.<<ETX>>


Archive | 1996

System and method for on-chip debug support and performance monitoring in a microprocessor

Gregory L. Ranson; John W. Bockhaus; Gregg B. Lesartre; Russell C. Brockmann; Robert E. Naas; Jonathan P. Lotz; Douglas B. Hunt; Patrick Knebel; Paul L. Perez; Steven T. Mangelsdorf


Archive | 1996

Operand dependency tracking system and method for a processor that executes instructions out of order and that permits multiple precision data words

Gregg B. Lesartre; Doug Quarnstrom; Jonathan P. Lotz


Archive | 1996

Method and system for recovering from cache misses

Jonathan P. Lotz; Gregg B. Lesartre; Donald Kipp


Archive | 2005

High reliability triple redundant latch with voting logic on each storage node

Jonathan P. Lotz; Daniel W. Krueger; Manuel Cabanas-Holmen


Archive | 2005

TRIPLE REDUNDANT LATCH DESIGN WITH STORAGE NODE RECOVERY

Manuel Cabanas-Holmen; Daniel W. Krueger; Jonathan P. Lotz


Archive | 1996

Fast nullify system and method for transforming a nullify function into a select function

Gregg B. Lesartre; Jonathan P. Lotz


Archive | 2004

High reliability triple redundant memory element with integrated testability and voting structures on each latch

John T. Petersen; Hassan Naser; Jonathan P. Lotz

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