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Dive into the research topics where Jong-sam Kim is active.

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Featured researches published by Jong-sam Kim.


asian solid state circuits conference | 2008

A 4 Gb/s 3-bit Parallel Transmitter With the Crosstalk-Induced Jitter Compensation Using TX Data Timing Control

Hae-Kang Jung; Kyoungho Lee; Jong-sam Kim; Jae-Jin Lee; Jae-Yoon Sim; Hong-June Park

By using the data timing control at the transmitter (TX), the crosstalk-induced jitter (CIJ) is compensated for in the 3-bit parallel data transmission through the coupled microstrip lines on printed circuit board (PCB). The difference in propagation velocity with the signal modes (odd, static, even) is compensated for by sending data earlier or later at TX according to the signal modes, so that the signals of different modes arrive at receiver at the same time. The proposed TX was implemented by using a 0.18 mum CMOS process. The measurement shows that the proposed TX reduces the RX jitters by about 30 ps (more than 50% of the added jitter due to CIJ and ISI) at the data rates from 2.6 Gb/s to 4.0 Gb/s. The proposed scheme can be applied to more than three parallel microstrip lines.


international solid-state circuits conference | 2014

25.3 A 1.35V 5.0Gb/s/pin GDDR5M with 5.4mW standby power and an error-adaptive duty-cycle corrector

Hyun Woo Lee; Junyoung Song; Sang Ah Hyun; Seunggeun Baek; Yuri Lim; Jungwan Lee; Minsu Park; Haerang Choi; Chang-kyu Choi; Jin-Youp Cha; Jae-il Kim; Hoon Choi; Seung-Wook Kwack; Yonggu Kang; Jong-sam Kim; Jung-hoon Park; Jonghwan Kim; Jinhee Cho; Chulwoo Kim; Yunsaing Kim; Jae-Jin Lee; Byongtae Chung; Sung-Joo Hong

The demand for high-bandwidth memories is increasing with an increase in the need for high-performance systems. Wide-I/O memory and GDDR5 are two types of high-bandwidth memories. GDDR5 is more compatible than wide I/O for contemporary systems, such as graphics cards and game consoles. The datarate of GDDR5 has reached 7Gb/s/pin. However, the power consumption and cost have increased owing to high-performance-oriented designs, die penalties, and additional test costs. DDR4 is an alternative low-cost memory with high performance in the range of 2.4 to 3.2Gb/s/pin [1]. However it is difficult for DDR4 DRAM to raise the 3.2Gb/s/pin bin portion to lower the cost. In DRAMs, the standby power and self-refresh power are more important than the operating power because DRAMs are mainly in the standby or self-refresh mode in systems. As the operating speed increases, the data window is narrowed, and the jitter increases. Therefore, a duty-cycle corrector (DCC) is employed to increase the data window when the external clock duty cycle is distorted in GDDR5 [2]. The bang-bang jitter caused by the DCC is inevitable even if the external clock duty ratio is exactly 50%. Sometimes the DCC may distort the data window because of an internal DCC offset. This paper presents a GDDR5M (mainstream) memory for graphics cards and a small-outline dual-inline memory module (SO-DIMM). The standby power is managed by the auto-sync mode. Additionally, the architecture of GDDR5M is similar to that of DDR4, and not GDDR5. The error-adaptive DCC can remove the initial duty-cycle offset automatically and remove the bang-bang jitter when the duty cycle of the external clock is not distorted.


international solid-state circuits conference | 2013

A 27% reduction in transceiver power for single-ended point-to-point DRAM interface with the termination resistance of 4×Z 0 at both TX and RX

Soo-Min Lee; Jong-Hoon Kim; Jong-sam Kim; Yunsaing Kim; Hyun-Bae Lee; Jae-Yoon Sim; Hong-June Park

The transceiver power is reduced by 27% in the single-ended point-to-point DRAM interface by increasing the termination resistance to 4×Z0 at both ends of TX and RX. The resultant increase of ISI and reflection is compensated for at RX by using the 1-tap and 2-tap integrating decision-feedback equalizer (IDFE), respectively, where the reflection tap position and the tap coefficients are found automatically during the training mode. This improves the bathtub opening of a 4-inch FR4 channel from 20% to 62.5% at 5Gb/s in 0.13μm CMOS.


Microscopy and Microanalysis | 2010

Ultra-thin TEM Sample Preparation with Advanced Backside FIB Milling Method

H-J Kang; Jong-sam Kim; Jw Oh; Ts Back; Hyung-Chul Kim


Archive | 2008

Plumping voltage generating circuit

Jong-sam Kim; Jong-Chern Lee


Archive | 2001

Method for forming self aligned contacts

Jong-sam Kim; Il-Wook Kim; Dong-kuk Lee; Phil-goo Kong


Archive | 2016

Memory device and method of refreshing the same

Jong-sam Kim; Jae-il Kim; Youk-hee Kim; Jun-Gi Choi; Hee-Seong Kim


Archive | 2016

NONVOLATILE MEMORY CIRCUIT AND MEMORY DEVICE INCLUDING SAME

Jong-sam Kim; Jae-il Kim


Microscopy and Microanalysis | 2012

Advanced TEM Sample Preparation Technique using FIB Tilt Stage Method

Jong-sam Kim; Tae Yeon Seong; Ts Back; Hyunsook Kim; C. Kim


Archive | 2010

INTERNAL VOLTAGE CONTROL CIRCUIT

Jong-sam Kim

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Hong-June Park

Pohang University of Science and Technology

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Jae-Yoon Sim

Pohang University of Science and Technology

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