Kai D. Feng

On-chip accelerated failure indicator

Test Structure for Determination of TSV Depth

PHYSICAL UNCLONABLE FUNCTION CELL AND ARRAY

Embedded on-chip security

Physical unclonable interconnect function array

Method and apparatus for preventing circuit failure

MULTIPLE STATUS E-FUSE BASED NON-VOLATILE VOLTAGE CONTROL OSCILLATOR CONFIGURED FOR PROCESS VARIATION COMPENSATION, AN ASSOCIATED METHOD AND AN ASSOCIATED DESIGN STRUCTURE

Method of operating transistors and structures thereof for improved reliability and lifetime

Semiconductor device including enhanced variability

Integrated circuit pad modeling