Keith H. Tabakman | Researchain

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Featured researches published by Keith H. Tabakman.

Archive | 2013

Field Effect Transistor Device

Kevin K. Chan; Abhishek Dube; Eric C. Harley; Judson R. Holt; Viorel Ontalus; Kathryn T. Schonenberg; Matthew W. Stoker; Keith H. Tabakman; Linda Black

Archive | 2014

PRE-GATE, SOURCE/DRAIN STRAIN LAYER FORMATION

Judson R. Holt; Viorel Ontalus; Keith H. Tabakman

Archive | 2010

Stressed transistor with improved metastability

Thomas N. Adam; Stephen W. Bedell; Abhishek Dube; Eric C. Harley; Judson R. Holt; Devendra K. Sadana; Dominic J. Schepis; Matthew W. Stoker; Keith H. Tabakman

Archive | 2014

FORMING FINS OF DIFFERENT SEMICONDUCTOR MATERIALS ON THE SAME SUBSTRATE

Huiling Shang; Keith H. Tabakman; Henry K. Utomo; Reinaldo A. Vega

Archive | 2012

Semiconductor device and method with greater epitaxial growth on 110 crystal plane

Thomas N. Adam; Kangguo Cheng; Judson R. Holt; Keith H. Tabakman

Archive | 2014

FINFET WITH DIELECTRIC ISOLATION AFTER GATE MODULE FOR IMPROVED SOURCE AND DRAIN REGION EPITAXIAL GROWTH

Eric C. Harley; Judson R. Holt; Yue Ke; Rishikesh Krishnan; Keith H. Tabakman; Henry K. Utomo

Archive | 2014

THIRD TYPE OF METAL GATE STACK FOR CMOS DEVICES

Ramachandra Divakaruni; Sameer H. Jain; Viraj Y. Sardesai; Keith H. Tabakman

Archive | 2008

METHOD OF PERFORMING MEASUREMENT SAMPLING OF LOTS IN A MANUFACTURING PROCESS

Gary W. Behm; Yue Li; Malek Ben Salem; Keith H. Tabakman

214th ECS Meeting | 2008

SiGe Selective Epitaxy: Morphology and Thickness Control for High Performance CMOS Technology

Judson R. Holt; Eric C. Harley; Thomas N. Adam; Shwu-Jen Jeng; Keith H. Tabakman; Rohit Pal; Hasan M. Nayfeh; Linda Black; Jeremy J. Kempisty; Matthew W. Stoker; Abhishek Dube; Dominic J. Schepis

Archive | 2015