Martin W. Bayes
Dow Chemical Company
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Featured researches published by Martin W. Bayes.
international microsystems, packaging, assembly and circuits technology conference | 2012
Ming-Yao Yen; Ming-Hung Chiang; Hsu-Hsin Tai; Hsien-Chang Chen; Kwok-Wai Yee; Crystal Li; Mark Lefebvre; Martin W. Bayes
The combination of specialized equipment and new copper via fill chemistry offers end users a cost effective, highly capable and production proven process for IC package substrate microvias filling. A new, insoluble anode, DC microvia fill system is now available for high volume manufacturing (HVM), offering additional operating flexibility and end user preference.
international microsystems, packaging, assembly and circuits technology conference | 2010
C. M. Chan; K. H. Tong; S. L. Leung; P. S. Wong; Kwok-Wai Yee; Martin W. Bayes
Electroless nickel and immersion gold (ENIG) is one of the most common final finishes used in PCBs. ENIG surfaces exhibit excellent planarity, solderability and wire bondability and tolerate multiple lead free solder reflows during assembly processing. However, the price of gold has increased rapidly from around
international microsystems, packaging, assembly and circuits technology conference | 2009
Mark Lefebvre; Elie H. Najjar; Luis Gomez; Leon R. Barstad; Bruce Chen; Martin W. Bayes
400 US per troy ounce in 2004 to over
Archive | 2000
Denis Morrissey; David Merricks; Leon R. Barstad; Eugene N. Step; Jeffrey M. Calvert; Robert A Schetty; James G. Shelnut; Mark Lefebvre; Martin W. Bayes; Donald E. Storjohann
1200 US in 2010. This change has increased ENIG operating costs for PCB manufacturers. While many customers have considered operating their immersion gold baths at levels well below the normal product operating ranges, making this change without proper qualification may have a negative impact on ENIG coating performance. In order to avoid such risks, we have developed a new immersion gold product, designed to operate at lower gold concentration, while ensuring that performance characteristics, including deposition rate, the impact on the electroless nickel layer during the displacement reaction and the coverage of the final deposit, are maintained at the required levels.
Archive | 2003
Lee M. Cook; Mark Lefebvre; Martin W. Bayes
Electrolytic copper microvia filling is an enabling technology, prominently used in todays manufacture of advanced HDI and packaging substrate product. In the high volume mass production of copper filled microvias, a wide variety of electroplating equipment designs are available to the fabricator. In this article, various aspects of electroplating equipment design used in the mass production of copper filled microvias are discussed, including a comparison of continuous and batch systems, anode materials, solution delivery (convection), and copper replenishment. The impacts of these variables on microvia filling performance, plated through hole throwing power, surface distribution, trace profile and bath life are described.
Archive | 2001
David Merricks; Denis Morrissey; Martin W. Bayes; Mark Lefebvre; James G. Shelnut; Donald E. Storjohann
Archive | 2003
Martin W. Bayes; Lee M. Cook; Mark Lefebvre
Archive | 2001
David Merricks; Denis Morrissey; Martin W. Bayes; Mark Lefebvre; James G. Shelnut; Donald E. Storjohann
Archive | 2001
Martin W. Bayes; Mark Lefebvre; David Merricks; Denis Morrissey; James G. Shelnut; Donald E. Storjohann
Archive | 2001
Martin W. Bayes; Mark Lefebvre; David Merricks; Denis Morrissey; James G. Shelnut; Donald E. Storjohann