Patrick Press
Advanced Micro Devices
Network
Latest external collaboration on country level. Dive into details by clicking on the dots.
Publication
Featured researches published by Patrick Press.
international symposium on vlsi technology, systems, and applications | 2007
Jay W. Strane; David E. Brown; Christian Lavoie; Jun Suenaga; Bala Haran; Patrick Press; Paul R. Besser; Philip L. Flaitz; Michael A. Gribelyuk; Thorsten Kammler; Igor Peidous; Huajie Chen; Stephan Waidmann; Asa Frye; Patrick W. DeHaven; Anthony G. Domenicucci; Conal E. Murray; Randolph F. Knarr; H.J. Engelmann; Christof Streck; Volker Kahlert; Sadanand V. Deshpande; Effendi Leobandung; John G. Pellerin; Jaga Jagannathan
Addition of Pt to Ni silicide produces a robust [NixPt(1-x)]Si, which shows an improved morphological stability, an important reduction in encroachment defect density, a reduced tendency to form NiSi2 and significant variations in monosilicide texture without degrading the device performance or the yield of high-performance 65 nm SOI technologies.
Archive | 2006
Thorsten Kammler; Patrick Press; Rolf Stephan; Sven Beyer
Archive | 2007
Sven Beyer; Manfred Horstmann; Patrick Press; Wolfgang Buchholtz
Archive | 2007
Sven Beyer; Patrick Press; Thomas Feudel
Microelectronic Engineering | 2006
Stephan Waidmann; Volker Kahlert; Christof Streck; Patrick Press; Thorsten Kammler; K. Dittmar; Inka Zienert; Jochen Rinderknecht
Archive | 2007
Patrick Press; Karla Romero; Martin Trentzsch; Karsten Wieczorek; Thomas Feudel; Markus Lenski; Rolf Stephan
Archive | 2007
Patrick Press; Thomas Feudel; Joe Bloomquist; Manfred Horstmann
Archive | 2006
Igor Peidous; Patrick Press; Rolf Stephan
Archive | 2008
Patrick Press; Frank Wirbeleit; Joe Bloomquist; Kai Frohberg; Thomas Feudel
Archive | 2008
Wolfgang Buchholtz; Sven Beyer; Manfred Horstmann; Patrick Press