Paul F. J. Geraedts

A 10-bit Charge-Redistribution ADC Consuming 1.9

This paper presents a 10 bit successive approximation ADC in 65 nm CMOS that benefits from technology scaling. It meets extremely low power requirements by using a charge-redistribution DAC that uses step-wise charging, a dynamic two-stage comparator and a delay-line-based controller. The ADC requires no external reference current and uses only one external supply voltage of 1.0 V to 1.3 V. Its supply current is proportional to the sample rate (only dynamic power consumption). The ADC uses a chip area of approximately 115×225 μm2. At a sample rate of 1 MS/s and a supply voltage of 1.0 V, the 10 bit ADC consumes 1.9 μW and achieves an energy efficiency of 4.4 fJ/conversion-step.

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An ADC for energy scavenging is proposed using a charge-redistribution DAC, a dynamic 2-stage comparator, and a delay-line-based controller realized in CMOS. The charge-redistribution DAC can be used in a simple way to make a SAR ADC. The 10b differential ADC uses bootstrapped NMOS devices to sample the differential input voltage onto two identical charge-redistribution DACs. The test chip is fabricated in a 65nm CMOS process. In this ADC, the MSB is set in between the sampling phase and the first comparison, saving energy and time.

W at 1 MS/s

This brief analyzes the jitter as well as the power dissipation of phase-locked loops (PLLs). It aims at defining a benchmark figure-of-merit (FOM) that is compatible with the well-known FOM for oscillators but now extended to an entire PLL. The phase noise that is generated by the thermal noise in the oscillator and loop components is calculated. The power dissipation is estimated, focusing on the required dynamic power. The absolute PLL output jitter is calculated, and the optimum PLL bandwidth that gives minimum jitter is derived. It is shown that, with a steep enough input reference clock, this minimum jitter is independent of the reference frequency and output frequency for a given PLL power budget. Based on these insights, a benchmark FOM for PLL designs is proposed.

A 1.9μW 4.4fJ/Conversion-step 10b 1MS/s Charge-Redistribution ADC

Both ring oscillators and relaxation oscillators are subsets of RC oscillators featuring large tuning ranges and small areas. Such relaxation oscillators have two advantages with respect to ring oscillators: 1) they have a constant frequency tuning gain; and 2) their phase can be read out continuously due to their triangular (or sawtooth) waveform. A major disadvantage of practical relaxation oscillators is their poor phase-noise compared to ring oscillators.

Jitter Analysis and a Benchmarking Figure-of-Merit for Phase-Locked Loops

A digital-to-time converter (DTC) controls time delay by a digital code, which is useful, for example, in a sampling oscilloscope, fractional-N PLL, or time-interleaved ADC. This paper proposes constant-slope charging as a method to realize a DTC with intrinsically better integral non-linearity (INL) compared to the popular variable-slope method. The proposed DTC chip realized in 65 nm CMOS consists of a voltage-controlled variable-delay element (DTC-core) driven by a 10 bit digital-to-analog converter. Measurements with a 55 MHz crystal clock demonstrate a full-scale delay programmable from 19 ps to 189 ps with a resolution from 19 fs to 185 fs. As available oscilloscopes are not good enough to reliably measure such high timing resolution, a frequency-domain method has been developed that modulates a DTC edge and derives INL from spur strength. An INL of 0.17% at 189 ps full-scale delay and 0.34% at 19 ps are measured, representing 8-9 bit effective INL-limited resolution. Output rms jitter is better than 210 fs limited by the test setup, while the DTC consumes 1.8 mW.

A 90μW 12MHz Relaxation Oscillator with a -162dB FOM

A relaxation oscillator design is described, which has a phase noise rivaling ring oscillators, while also featuring linear frequency tuning. We show that the comparator in a relaxation-oscillator loop can be prevented from contributing to 1/f2 colored phase noise and degrading control linearity. The resulting oscillator is implemented in a power efficient way with a switched-capacitor circuit. The design results from a thorough analysis of the fundamental phase noise contributions. Simple expressions modeling the theoretical phase noise performance limit are presented, as well as a design strategy to approach this limit. To verify theoretical predictions, a relaxation oscillator is implemented in a baseline 65nm CMOS process, occupying 200µm × 150µm. Its frequency tuning range is 1-12MHz, and its phase noise is L100kHz=-109dBc/Hz at fosc=12MHz, while consuming 90µW. A figure of merit of -161dBc/Hz is achieved, which is only 4dB from the theoretical limit. Copyright