Peter C. Newman
Cymer, Inc.
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Featured researches published by Peter C. Newman.
26th Annual International Symposium on Microlithography | 2001
Thomas P. Duffey; Gerry M. Blumenstock; Vladimir B. Fleurov; Xiaojiang Pan; Peter C. Newman; Holger K. Glatzel; Tom A. Watson; Jeffrey Erxmeyer; Ralf Kuschnereit; Bernhard Weigl
The next generation 193 nm (ArF) laser has been designed and developed for high-volume production lithography. The NanoLithTM 7000, offering 20 Watts average output power at 4 kHz repetition rates is designed to support the highest exposure tool scan speeds for maximum productivity and wafer throughput. Fundamental design changes made to the laser core technologies are described. These advancements in core technology support the delivery of highly line-narrowed light with <EQ 0.35 pm FWHM and <EQ 0.95 pm at 95% included energy integral, enabling high contrast imaging from exposure tools with lens NA exceeding 0.75. The system has been designed to support production lithography, meeting specifications for bandwidth, dose stability (+/- 0.3% in 20 ms window) and wavelength stability (+/- 0.05 pm average line center error in 20 ms window) across 2 - 4 kHz repetition rates. Improvements in optical materials and coatings have led to increased lifetime of optics modules. Optimization of the discharge electrode design has increased chamber lifetime. Early life-testing indicates that the NanoLithTM core technologies have the potential for 400% reduction of cost of consumables as compared to its predecessor, the ELX-5000A and has been discussed elsewhere.
SPIE's 27th Annual International Symposium on Microlithography | 2002
Choonghoon Oh; Vladimir B. Fleurov; Thomas Hofmann; Thomas P. Duffey; Fedor Trintchouk; Patrick O'Keeffe; Peter C. Newman; Gerry M. Blumenstock
Semiconductor chip manufacturing is on the verge of a new production process node driving critical feature sizes below 100 nm. The next generation of 193 nm Argon Fluoride laser, the NanoLithTM 7000, has been developed in response to this recent technology development in the lithography industry. The NanoLithTM 7000, offering 20 Watts average output power at 4 kHz repetition rate, is designed to support the highest exposure tool scan speeds for maximum productivity and wafer throughput. Technology improvements to support the move from pilot production to full production will be described. With core technology defined and performance to specification established, attention turns to cost of operation, which is closely tied to module lifetime and reliability. Here we present results of the NanoLithTM 7000 system lifetest tracking all optical performance data over a 4.4 Billion shot. The system is operated in firing modes ranging from 1-4 kHz, and up to 75% duty cycle. Overall system performance measured to date both in the lab and in the field suggests that this laser meets all the production requirements for 193 nm lithography.
Archive | 1999
David W. Myers; Herve A. Besaucele; Palash P. Das; Thomas P. Duffey; Alexander I. Ershov; Igor V. Fomenkov; Thomas Hofmann; Richard G. Morton; Richard M. Ness; Peter C. Newman; Robert G. Ozarski; Gamaralalage G. Padmabandu; William N. Partlo; Daniel A. Rothweil; Richard L. Sandstrom; Paul S. Thompson; Richard C. Ujazdowski; Tom A. Watson; R. Kyle Webb; Paolo Zambon
Archive | 1999
Peter C. Newman; Richard L. Sandstrom
Archive | 2001
Peter C. Newman; Thomas P. Duffey; William N. Partlo; Richard L. Sandstrom; Paul C. Melcher; David M. Johns; Robert B. Saethre; Vladimir B. Fleurov; Richard M. Ness; Curtis L. Rettig; Robert A. Shannon; Richard C. Ujazdowski; Shahryar Rokni; Xiaojiang J. Pan; Vladimir Kulgeyko; Scott T. Smith; Stuart L. Anderson; John M Algots; Ronald L. Spangler; Igor V. Fomenkov
Archive | 2001
William N. Partlo; Richard L. Sandstrom; Holzer K. Glatzel; Raymond F. Cybulski; Peter C. Newman; James K. Howey; William G. Hulburd; John T. Melchior; Alex P. Ivaschenko
Archive | 2000
Peter C. Newman; John T. Melchior; Richard L. Sandstrom
Archive | 2001
Peter C. Newman; John Van Doorn; Darrel W. Fullen; William H. Clopton; Shahryar Rokni
Archive | 1999
Herve A. Besaucele; Toshihiko Ishihara; T Melchior John; Richard G. Morton; Richard M. Ness; Peter C. Newman; William N. Partlo; Daniel A. Rothweil; Richard L. Sandstrom; P Daffy Thomas; エヌ パートロ ウィリアム; ティー メルチオー ジョン; エイ ロスウェイル ダニエル; ピー ダフィー トーマス; エイ ベゾーセル ハーヴィ; シー ニューマン ピーター; エム ネス リチャード; エル サンドストローム リチャード; ジー モートン リチャード; 俊彦 石原
Archive | 1999
Peter C. Newman; Richard L. Sandstrom; シー ニューマン ピーター; エル サンドストローム リチャード