Ryusuke Nebashi

Nonvolatile Magnetic Flip-Flop for Standby-Power-Free SoCs

This paper presents a new nonvolatile magnetic flip-flop (MFF) for standby-power-critical applications. An MFF primitive cell for design libraries has been developed using 150 nm, 1.5 V CMOS and 240 nm MRAM processes. It has advantages over other nonvolatile flip-flops in high-speed store operations without endurance limitations. It also has high design compatibility with conventional CMOS LSI designs because it does not include any additional power lines and special transistors. A toggle frequency of 3.5 GHz was achieved by a SPICE simulation, which is comparable to that of a normal CMOS DFF in the same generation. The maximum frequency in a store operation was also estimated to be 500 MHz with 1-ns current width for the data backup. An MFF test chip, which includes 16-stage 8-bit shift register using MFFs, was fabricated with these processes. A 333 MHz store operation was measured without failed bits. The functional performance was sufficiently high to demonstrate the potential of MFFs, which helps to reduce the power dissipation of systems on chips (SoCs) dramatically.

A 90nm 12ns 32Mb 2T1MTJ MRAM

Since MRAM cells have unlimited write endurance, they can be used as substitutes for DRAMs or SRAMs. MRAMs in electronic appliances enhance their convenience and energy efficiency because data in MRAMs are nonvolatile and retained even in the power-off state. Therefore, 2 to 16Mb standalone MRAMs have been developed [1–4]. However, in terms of their random-access times, they are not enough fast (25ns) [1] as substitutes for all kinds of stand-alone DRAMs or SRAMs. To attain a standalone MRAM with both a fast random-access time and a large capacity, we adopt a cell structure with 2 transistors and 1 magnetic tunneling junction (2T1MTJ), which we previously published for a 1Mb embedded MRAM macro [5]. We need to develop circuit schemes to achieve a larger memory capacity and a higher cell-occupation ratio with small access-time degradation. We describe the circuit schemes of a 32Mb MRAM, which enable 63% cell occupation ratio and 12ns access time.

Nonvolatile Magnetic Flip-Flop for standby-power-free SoCs

This paper presents a new nonvolatile magnetic flip-flop (MFF) for standby-power-critical applications. An MFF primitive cell for design libraries has been developed using 150 nm, 1.5 V CMOS and 240 nm MRAM processes. It has advantages over other nonvolatile flip-flops in high-speed store operations without endurance limitations. It also has high design compatibility with conventional CMOS LSI designs because it does not include any additional power lines and special transistors. A toggle frequency of 3.5 GHz was achieved by a SPICE simulation, which is comparable to that of a normal CMOS DFF in the same generation. The maximum frequency in a store operation was also estimated to be 500 MHz with 1-ns current width for the data backup. An MFF test chip, which includes 16-stage 8-bit shift register using MFFs, was fabricated with these processes. A 333 MHz store operation was measured without failed bits. The functional performance was sufficiently high to demonstrate the potential of MFFs, which helps to reduce the power dissipation of systems on chips (SoCs) dramatically.

10.5 A 90nm 20MHz fully nonvolatile microcontroller for standby-power-critical applications

Recently there has been increased demand for not only ultra-low power, but also high performance, even in standby-power-critical applications. Sensor nodes, for example, need a microcontroller unit (MCU) that has the ability to process signals and compress data immediately. A previously reported 130nm CMOS and FeRAM-based MCU features zero-standby power and fast wakeup operation by incorporating FeRAM devices into logic circuits [1]. The 8MHz speed, however, was not sufficiently high to meet application requirements, and the FeRAM process also has drawbacks: low compatibility with standard CMOS, and write endurance limitations. A spintronics-based nonvolatile integrated circuit is a promising option to achieve zero standby power and high-speed operation, along with compatibility with CMOS processes. In this work, we demonstrate a fully nonvolatile 16b MCU using 90nm standard CMOS and three-terminal SpinRAM technology. It achieves 20MHz, 145μW/MHz operation with a 1V supply in the active state, and 4.5μW intermittent operation with 120ns wakeup time and 0.1% active ratio, without forwarding of re-boot code from memory. The features provide sufficiently long battery life to achieve maintenance-free sensor nodes.

Nonvolatile logic-in-memory array processor in 90nm MTJ/MOS achieving 75% leakage reduction using cycle-based power gating

Nonvolatile logic-in-memory (NV-LIM) architecture [1], where magnetic tunnel junction (MTJ) devices [2] are distributed over a CMOS logic-circuit plane, has the potential of overcoming the serious power-consumption problem that has rapidly become a dominant constraint on the performance improvement of todays VLSI processors. Normally-off and instant-on capabilities with a small area penalty due to non-volatility and three-dimensional-stackability of MTJ devices in the above structure allow us to apply a power-gating technique in a fine temporal granularity, which can perfectly eliminate wasted power dissipation due to leakage current. The impact of embedding nonvolatile memory devices into a logic circuit was, however, demonstrated by using only small fabricated primitive logic-circuit elements [3], memory-like structures such as FPGA [4], or circuit simulation because of the lack of an established MTJ-oriented design flow reflecting the chip-fabrication environment, while larger-capacity and/or high-speed-access MRAM has been increasingly developed. In this paper, we present an MTJ/MOS-hybrid video coding hardware that uses a cycle-based power-gating technique for a practical-scale MTJ-based NV-LIM LSI, which is fully designed using the established semi-automated MTJ-oriented design flow.

High-speed simulator including accurate MTJ models for spintronics integrated circuit design

An extremely practical simulation program with integrated circuits emphasis (SPICE) incorporating model parameters of magnetic tunnel junction (MTJ) was developed. The simulator provides reliable simulation results in spintronics circuit design because it can accurately calculate various MTJ characteristics that actual devices have, that considerably influence the operation margin and power dissipation. It can also accelerate the simulation speed, which makes it possible to simulate three times or more large-scale circuits than when a conventional macro-model is used.

Improvement of Thermal Stability of Magnetoresistive Random Access Memory Device with SiN Protective Film Deposited by High-Density Plasma Chemical Vapor Deposition

Embedded magnetoresistive random access memory (MRAM) with multi-level interconnects necessitates that magnetic tunnel junction (MTJ) devices have a thermal stability of 350 °C or higher during fabrication. We have improved thermal stability of MRAM devices using SiN protective film deposited by high-density plasma chemical vapor deposition (HDP-CVD) at 200 °C. The MTJ devices with HDP-CVD SiN protective film did not degrade after post-annealing at 350 °C, which suggests that the HDP-CVD process reduced oxide metal on the etched surface of the MTJ devices and that the SiN film blocked H2O diffusion from the interlayer dielectric film during post-annealing at 350 °C. We also fabricated a 1-kbit MRAM array and experimentally demonstrated thermal stability at 350 °C.

High-speed and reliable domain wall motion device: Material design for embedded memory and logic application

High-speed capability and excellent reliability of a magnetic domain wall (DW) motion device required for embedded memory and logic-in-memory applications were achieved by optimizing the film stack structure of Co/Ni wire. Low-current with high-speed writing, high heat resistance, low error rate, wide operation range for temperature and magnetic field, high retention, and high endurance features were confirmed.

Nonvolatile Logic-in-Memory LSI Using Cycle-Based Power Gating and its Application to Motion-Vector Prediction

A magnetic tunnel junction (MTJ)-based logic-in-memory hardware accelerator LSI with cycle-based power gating is fabricated using a 90 nm MTJ/MOS process on a 300 mm wafer fabrication line for practical-scale, fully parallel motion-vector prediction, without wasted power dissipation. The proposed nonvolatile LSI is designed by establishing an automated design environment with MTJ-based logic-circuit IPs and peripheral assistant tools, as well as a precise MTJ device model produced by the fabricated test chips. Through the measurement results of the fabricated LSI, this study shows both the impact of the power-gating technique in a fine temporal granularity utilizing the non-volatility of the MTJ device and the effectiveness of the established automated design environment for designing random logic LSI using nonvolatile logic-in-memory.

A 250-MHz 1-Mbit embedded MRAM macro using 2T1MTJ cell with bitline separation and half-pitch shift architecture

A 250-MHz 1-Mbit MRAM macro is demonstrated in a 0.15-mum standard CMOS process with 1.5-V supply. Its clock frequency is the highest among the MRAMs that have been reported. It has a highly compatible embedded-SRAM interface. The macro is designed using a 6.97-mum2 bitline separated and half-pitch shifted 2-transistor 1-magnetic tunnel junction (2T1MTJ) cell. The half-pitch-shift arrangement enables efficient reduction of bitline capacitance and a symmetrical reading scheme, which accelerates the random access clock frequency to the same speed as that of SRAMs. The technology will help to achieve MRAM embedded systems on chips (SoCs).